2.86 µm room-temperature light emission of InGaAsN/GaAsSb type-II quantum well diodes grown on InP substrates
Room-temperature light emission at a wavelength of 2.86 µm was observed for In0.53Ga0.47As0.99N0.01/GaAs0.5Sb0.5 type-II quantum well (QW) diodes grown on InP substrates by molecular beam epitaxy (MBE), which is much longer than that (2.34 µm) for In0.53Ga0.47As/GaAs0.5Sb0.5 type-II QW diodes on InP...
Gespeichert in:
Veröffentlicht in: | Japanese Journal of Applied Physics 2014-01, Vol.53 (2), p.28004 |
---|---|
Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | 2 |
container_start_page | 28004 |
container_title | Japanese Journal of Applied Physics |
container_volume | 53 |
creator | Kawamura, Yuichi Sahashi, Toru |
description | Room-temperature light emission at a wavelength of 2.86 µm was observed for In0.53Ga0.47As0.99N0.01/GaAs0.5Sb0.5 type-II quantum well (QW) diodes grown on InP substrates by molecular beam epitaxy (MBE), which is much longer than that (2.34 µm) for In0.53Ga0.47As/GaAs0.5Sb0.5 type-II QW diodes on InP substrates. The temperature dependence of the electroluminescence (EL) spectrum indicates that the EL peak energy difference between these two diodes is 100 meV at all temperatures. |
doi_str_mv | 10.7567/JJAP.53.028004 |
format | Article |
fullrecord | <record><control><sourceid>iop_cross</sourceid><recordid>TN_cdi_crossref_primary_10_7567_JJAP_53_028004</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>BN130076</sourcerecordid><originalsourceid>FETCH-LOGICAL-c2180-de5e9a7bcf43d4497c720d56c0bec0de9652985a1a40f087a6a26a27d85281183</originalsourceid><addsrcrecordid>eNp1kNFKwzAUhoMoOKe3XudShHZJmjTp5Rg6O0QH6nVIm3S2tE1NWsYezBfwyWzZLhUO53Dg-w6HH4BbjELOYr7YbJbbkEUhIgIhegZmOKI8oChm52CGEMEBTQi5BFfeV-MaM4pnoCWhiOHPdwOdtU3Qm6YzTvWDM7Aud589NE3pfWlbaAuYtmu19C-Lqb9lsD90JkhT-DWoth8auDd1DXVptfFw5-x-dNrR2UI_ZL4frxp_DS4KVXtzc5pz8PH48L56Cp5f1-lq-RzkBAsUaMNMoniWFzTSlCY85wRpFucoMznSJokZSQRTWFFUIMFVrMhYXAtGBMYimoPweDd31ntnCtm5slHuIDGSU1pySkuySB7TGoX7o1DaTlZ2cO343v_w3R9wValugsgJk50uol8ExHgR</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>2.86 µm room-temperature light emission of InGaAsN/GaAsSb type-II quantum well diodes grown on InP substrates</title><source>IOP Publishing Journals</source><source>Institute of Physics (IOP) Journals - HEAL-Link</source><creator>Kawamura, Yuichi ; Sahashi, Toru</creator><creatorcontrib>Kawamura, Yuichi ; Sahashi, Toru</creatorcontrib><description>Room-temperature light emission at a wavelength of 2.86 µm was observed for In0.53Ga0.47As0.99N0.01/GaAs0.5Sb0.5 type-II quantum well (QW) diodes grown on InP substrates by molecular beam epitaxy (MBE), which is much longer than that (2.34 µm) for In0.53Ga0.47As/GaAs0.5Sb0.5 type-II QW diodes on InP substrates. The temperature dependence of the electroluminescence (EL) spectrum indicates that the EL peak energy difference between these two diodes is 100 meV at all temperatures.</description><identifier>ISSN: 0021-4922</identifier><identifier>EISSN: 1347-4065</identifier><identifier>DOI: 10.7567/JJAP.53.028004</identifier><identifier>CODEN: JJAPB6</identifier><language>eng</language><publisher>The Japan Society of Applied Physics</publisher><ispartof>Japanese Journal of Applied Physics, 2014-01, Vol.53 (2), p.28004</ispartof><rights>2014 The Japan Society of Applied Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c2180-de5e9a7bcf43d4497c720d56c0bec0de9652985a1a40f087a6a26a27d85281183</citedby><cites>FETCH-LOGICAL-c2180-de5e9a7bcf43d4497c720d56c0bec0de9652985a1a40f087a6a26a27d85281183</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.7567/JJAP.53.028004/pdf$$EPDF$$P50$$Giop$$H</linktopdf><link.rule.ids>314,776,780,27901,27902,53821,53868</link.rule.ids></links><search><creatorcontrib>Kawamura, Yuichi</creatorcontrib><creatorcontrib>Sahashi, Toru</creatorcontrib><title>2.86 µm room-temperature light emission of InGaAsN/GaAsSb type-II quantum well diodes grown on InP substrates</title><title>Japanese Journal of Applied Physics</title><addtitle>Jpn. J. Appl. Phys</addtitle><description>Room-temperature light emission at a wavelength of 2.86 µm was observed for In0.53Ga0.47As0.99N0.01/GaAs0.5Sb0.5 type-II quantum well (QW) diodes grown on InP substrates by molecular beam epitaxy (MBE), which is much longer than that (2.34 µm) for In0.53Ga0.47As/GaAs0.5Sb0.5 type-II QW diodes on InP substrates. The temperature dependence of the electroluminescence (EL) spectrum indicates that the EL peak energy difference between these two diodes is 100 meV at all temperatures.</description><issn>0021-4922</issn><issn>1347-4065</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNp1kNFKwzAUhoMoOKe3XudShHZJmjTp5Rg6O0QH6nVIm3S2tE1NWsYezBfwyWzZLhUO53Dg-w6HH4BbjELOYr7YbJbbkEUhIgIhegZmOKI8oChm52CGEMEBTQi5BFfeV-MaM4pnoCWhiOHPdwOdtU3Qm6YzTvWDM7Aud589NE3pfWlbaAuYtmu19C-Lqb9lsD90JkhT-DWoth8auDd1DXVptfFw5-x-dNrR2UI_ZL4frxp_DS4KVXtzc5pz8PH48L56Cp5f1-lq-RzkBAsUaMNMoniWFzTSlCY85wRpFucoMznSJokZSQRTWFFUIMFVrMhYXAtGBMYimoPweDd31ntnCtm5slHuIDGSU1pySkuySB7TGoX7o1DaTlZ2cO343v_w3R9wValugsgJk50uol8ExHgR</recordid><startdate>20140124</startdate><enddate>20140124</enddate><creator>Kawamura, Yuichi</creator><creator>Sahashi, Toru</creator><general>The Japan Society of Applied Physics</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20140124</creationdate><title>2.86 µm room-temperature light emission of InGaAsN/GaAsSb type-II quantum well diodes grown on InP substrates</title><author>Kawamura, Yuichi ; Sahashi, Toru</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2180-de5e9a7bcf43d4497c720d56c0bec0de9652985a1a40f087a6a26a27d85281183</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kawamura, Yuichi</creatorcontrib><creatorcontrib>Sahashi, Toru</creatorcontrib><collection>CrossRef</collection><jtitle>Japanese Journal of Applied Physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kawamura, Yuichi</au><au>Sahashi, Toru</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>2.86 µm room-temperature light emission of InGaAsN/GaAsSb type-II quantum well diodes grown on InP substrates</atitle><jtitle>Japanese Journal of Applied Physics</jtitle><addtitle>Jpn. J. Appl. Phys</addtitle><date>2014-01-24</date><risdate>2014</risdate><volume>53</volume><issue>2</issue><spage>28004</spage><pages>28004-</pages><issn>0021-4922</issn><eissn>1347-4065</eissn><coden>JJAPB6</coden><abstract>Room-temperature light emission at a wavelength of 2.86 µm was observed for In0.53Ga0.47As0.99N0.01/GaAs0.5Sb0.5 type-II quantum well (QW) diodes grown on InP substrates by molecular beam epitaxy (MBE), which is much longer than that (2.34 µm) for In0.53Ga0.47As/GaAs0.5Sb0.5 type-II QW diodes on InP substrates. The temperature dependence of the electroluminescence (EL) spectrum indicates that the EL peak energy difference between these two diodes is 100 meV at all temperatures.</abstract><pub>The Japan Society of Applied Physics</pub><doi>10.7567/JJAP.53.028004</doi><tpages>3</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0021-4922 |
ispartof | Japanese Journal of Applied Physics, 2014-01, Vol.53 (2), p.28004 |
issn | 0021-4922 1347-4065 |
language | eng |
recordid | cdi_crossref_primary_10_7567_JJAP_53_028004 |
source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
title | 2.86 µm room-temperature light emission of InGaAsN/GaAsSb type-II quantum well diodes grown on InP substrates |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-02T21%3A41%3A16IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-iop_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=2.86%20%C2%B5m%20room-temperature%20light%20emission%20of%20InGaAsN/GaAsSb%20type-II%20quantum%20well%20diodes%20grown%20on%20InP%20substrates&rft.jtitle=Japanese%20Journal%20of%20Applied%20Physics&rft.au=Kawamura,%20Yuichi&rft.date=2014-01-24&rft.volume=53&rft.issue=2&rft.spage=28004&rft.pages=28004-&rft.issn=0021-4922&rft.eissn=1347-4065&rft.coden=JJAPB6&rft_id=info:doi/10.7567/JJAP.53.028004&rft_dat=%3Ciop_cross%3EBN130076%3C/iop_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |