Large-area analysis of dislocations in ammonothermal GaN by synchrotron radiation X-ray topography

The large-area defect structure of high-quality ammonothermal GaN was studied by synchrotron radiation X-ray topography (SR-XRT) and high-resolution X-ray diffraction (XRD). The threading dislocation densities of mixed and screw dislocations were determined separately by SR-XRT and were 3.2 × 104 an...

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Veröffentlicht in:	Applied physics express 2014-09, Vol.7 (9), p.91003
Hauptverfasser:	Sintonen, Sakari, Suihkonen, Sami, Jussila, Henri, Danilewsky, Andreas, Stankiewicz, Romuald, Tuomi, Turkka O., Lipsanen, Harri
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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