USING REGULAR FRACTIONS OF TWO-LEVEL DESIGNS TO FIND BASELINE DESIGNS

Mukerjee and Tang (2012) established the K-aberration criterion for baseline two-level designs. This paper explores the use of the regular fractions of two-level designs 2m−p designs) to create baseline designs. Results are presented that establish relationships between the sequence of K-values for a baseline design and the word length pattern of the corresponding 2m−p design. Based on these results, methodology for creating baseline designs that have good K-aberration characteristics is developed and demonstrated.