Characterization of SiC Nanostructures in Crystalline and Porous Silicons formed by Ion Beam Synthesis

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Veröffentlicht in:Journal of the Korean Physical Society 2010-06, Vol.56 (6(1)), p.2063-2067
Hauptverfasser: Woo, Hyung-Joo, Kim, Gi-Dong, Choi, Han-Woo, Kim, Joon-Kon
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container_end_page 2067
container_issue 6(1)
container_start_page 2063
container_title Journal of the Korean Physical Society
container_volume 56
creator Woo, Hyung-Joo
Kim, Gi-Dong
Choi, Han-Woo
Kim, Joon-Kon
description
doi_str_mv 10.3938/jkps.56.2063
format Article
fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_3938_jkps_56_2063</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_3938_jkps_56_2063</sourcerecordid><originalsourceid>FETCH-LOGICAL-c1464-b6c676967033aa12456a66de189c5dc4802e28f2bacfe53e99e5e4d5b26e89543</originalsourceid><addsrcrecordid>eNot0LFOwzAUhWEPIFEKGw_gByDBie0bZ4QIaKUKkApz5DjXqktiV3Y6hKenFUxnOfqHj5C7guW85uph_31IuYS8ZMAvyILxSmRCKXFFrlPaMyY4r2BBbLPTUZsJo_vRkwueBku3rqFv2oc0xaOZjhETdZ42cU6THgbnkWrf048QwzGdzoMzwSdqQxyxp91M16fME-qRbmc_7TC5dEMurR4S3v7vkny9PH82q2zz_rpuHjeZKQSIrAMDFdRQMc61LkohQQP0WKjayN4IxUoslS07bSxKjnWNEkUvuxJQ1VLwJbn_65oYUopo20N0o45zW7D27NKeXVoJ7dmF_wL4O1o9</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Characterization of SiC Nanostructures in Crystalline and Porous Silicons formed by Ion Beam Synthesis</title><source>Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals</source><creator>Woo, Hyung-Joo ; Kim, Gi-Dong ; Choi, Han-Woo ; Kim, Joon-Kon</creator><creatorcontrib>Woo, Hyung-Joo ; Kim, Gi-Dong ; Choi, Han-Woo ; Kim, Joon-Kon</creatorcontrib><identifier>ISSN: 0374-4884</identifier><identifier>DOI: 10.3938/jkps.56.2063</identifier><language>eng ; jpn</language><ispartof>Journal of the Korean Physical Society, 2010-06, Vol.56 (6(1)), p.2063-2067</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c1464-b6c676967033aa12456a66de189c5dc4802e28f2bacfe53e99e5e4d5b26e89543</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids></links><search><creatorcontrib>Woo, Hyung-Joo</creatorcontrib><creatorcontrib>Kim, Gi-Dong</creatorcontrib><creatorcontrib>Choi, Han-Woo</creatorcontrib><creatorcontrib>Kim, Joon-Kon</creatorcontrib><title>Characterization of SiC Nanostructures in Crystalline and Porous Silicons formed by Ion Beam Synthesis</title><title>Journal of the Korean Physical Society</title><issn>0374-4884</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNot0LFOwzAUhWEPIFEKGw_gByDBie0bZ4QIaKUKkApz5DjXqktiV3Y6hKenFUxnOfqHj5C7guW85uph_31IuYS8ZMAvyILxSmRCKXFFrlPaMyY4r2BBbLPTUZsJo_vRkwueBku3rqFv2oc0xaOZjhETdZ42cU6THgbnkWrf048QwzGdzoMzwSdqQxyxp91M16fME-qRbmc_7TC5dEMurR4S3v7vkny9PH82q2zz_rpuHjeZKQSIrAMDFdRQMc61LkohQQP0WKjayN4IxUoslS07bSxKjnWNEkUvuxJQ1VLwJbn_65oYUopo20N0o45zW7D27NKeXVoJ7dmF_wL4O1o9</recordid><startdate>20100615</startdate><enddate>20100615</enddate><creator>Woo, Hyung-Joo</creator><creator>Kim, Gi-Dong</creator><creator>Choi, Han-Woo</creator><creator>Kim, Joon-Kon</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20100615</creationdate><title>Characterization of SiC Nanostructures in Crystalline and Porous Silicons formed by Ion Beam Synthesis</title><author>Woo, Hyung-Joo ; Kim, Gi-Dong ; Choi, Han-Woo ; Kim, Joon-Kon</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1464-b6c676967033aa12456a66de189c5dc4802e28f2bacfe53e99e5e4d5b26e89543</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng ; jpn</language><creationdate>2010</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Woo, Hyung-Joo</creatorcontrib><creatorcontrib>Kim, Gi-Dong</creatorcontrib><creatorcontrib>Choi, Han-Woo</creatorcontrib><creatorcontrib>Kim, Joon-Kon</creatorcontrib><collection>CrossRef</collection><jtitle>Journal of the Korean Physical Society</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Woo, Hyung-Joo</au><au>Kim, Gi-Dong</au><au>Choi, Han-Woo</au><au>Kim, Joon-Kon</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Characterization of SiC Nanostructures in Crystalline and Porous Silicons formed by Ion Beam Synthesis</atitle><jtitle>Journal of the Korean Physical Society</jtitle><date>2010-06-15</date><risdate>2010</risdate><volume>56</volume><issue>6(1)</issue><spage>2063</spage><epage>2067</epage><pages>2063-2067</pages><issn>0374-4884</issn><doi>10.3938/jkps.56.2063</doi><tpages>5</tpages></addata></record>
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language eng ; jpn
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title Characterization of SiC Nanostructures in Crystalline and Porous Silicons formed by Ion Beam Synthesis
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-11T03%3A43%3A38IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Characterization%20of%20SiC%20Nanostructures%20in%20Crystalline%20and%20Porous%20Silicons%20formed%20by%20Ion%20Beam%20Synthesis&rft.jtitle=Journal%20of%20the%20Korean%20Physical%20Society&rft.au=Woo,%20Hyung-Joo&rft.date=2010-06-15&rft.volume=56&rft.issue=6(1)&rft.spage=2063&rft.epage=2067&rft.pages=2063-2067&rft.issn=0374-4884&rft_id=info:doi/10.3938/jkps.56.2063&rft_dat=%3Ccrossref%3E10_3938_jkps_56_2063%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true