Structural Analysis of a Mo/Si EUV Reflector by Optical Modeling

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Veröffentlicht in:Journal of the Korean Physical Society 2003-11, Vol.43 (5), p.822-825
Hauptverfasser: Kang, In-Yong, Chung, Chan-Yeup, Chung, Yong-Chae, Kim, Taegeun, Lee, Seung Yoon, Ahn, Jinho
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container_issue 5
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container_title Journal of the Korean Physical Society
container_volume 43
creator Kang, In-Yong
Chung, Chan-Yeup
Chung, Yong-Chae
Kim, Taegeun
Lee, Seung Yoon
Ahn, Jinho
description
doi_str_mv 10.3938/jkps.43.822
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title Structural Analysis of a Mo/Si EUV Reflector by Optical Modeling
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