In situ AFM Investigation of Interfacial Morphology of Single Crystal Silicon Wafer Anode

In situ AFM Investigation of Interfacial Morphology of Single Crystal Silicon Wafer Anode

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Wuli huaxue xuebao 2016-01, Vol.32 (1), p.283-289
Hauptverfasser: LIU, Xing-Rui, YAN, Hui-Juan, WANG, Dong, WAN, Li-Jun
Format: Artikel
Sprache:chi ; eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 289
container_issue 1
container_start_page 283
container_title Wuli huaxue xuebao
container_volume 32
creator LIU, Xing-Rui
YAN, Hui-Juan
WANG, Dong
WAN, Li-Jun
description
doi_str_mv 10.3866/PKU.WHXB201511132
format Article
fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_3866_PKU_WHXB201511132</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_3866_PKU_WHXB201511132</sourcerecordid><originalsourceid>FETCH-LOGICAL-c288t-2a937903374fb1633d0a98c05d9b5d84c29776768323c52a525d04acb72e4f873</originalsourceid><addsrcrecordid>eNpVkLFOwzAYhD2ARCk8AJtfIOW3ndjOGCpKI1qBVKrCFDmOHYxCXNkBKW9PKliYTrpPd8OH0A2BBZOc3z4_7heH9esdBZIRQhg9QzMCAAmXRF6gyxg_ABgQLmforexxdMMXLlZbXPbfJg6uVYPzPfZ2KgYTrNJOdXjrw_Hdd74dT2Tn-rYzeBnGOExw5zqnp81BWRNw0fvGXKFzq7porv9yjvar-5flOtk8PZTLYpNoKuWQUJUzkQNjIrU14Yw1oHKpIWvyOmtkqmkuBBdcMsp0RlVGswZSpWtBTWqlYHNEfn918DEGY6tjcJ8qjBWB6uSjmnxU_3ywH1gSVS8</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>In situ AFM Investigation of Interfacial Morphology of Single Crystal Silicon Wafer Anode</title><source>Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals</source><creator>LIU, Xing-Rui ; YAN, Hui-Juan ; WANG, Dong ; WAN, Li-Jun</creator><creatorcontrib>LIU, Xing-Rui ; YAN, Hui-Juan ; WANG, Dong ; WAN, Li-Jun ; 中国科学院化学研究所，分子纳米结构与纳米技术实验室，北京分子科学国家实验室，北京 100190, CAS Key Laboratory of Molecular Nanostructure and Nanotechnology, Beijing National Laboratory for Molecular Sciences, Institute of Chemistry, Chinese Academy of Sciences, Beijing 100190, P. R. China</creatorcontrib><identifier>ISSN: 1000-6818</identifier><identifier>DOI: 10.3866/PKU.WHXB201511132</identifier><language>chi ; eng</language><ispartof>Wuli huaxue xuebao, 2016-01, Vol.32 (1), p.283-289</ispartof><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c288t-2a937903374fb1633d0a98c05d9b5d84c29776768323c52a525d04acb72e4f873</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>LIU, Xing-Rui</creatorcontrib><creatorcontrib>YAN, Hui-Juan</creatorcontrib><creatorcontrib>WANG, Dong</creatorcontrib><creatorcontrib>WAN, Li-Jun</creatorcontrib><creatorcontrib>中国科学院化学研究所，分子纳米结构与纳米技术实验室，北京分子科学国家实验室，北京 100190, CAS Key Laboratory of Molecular Nanostructure and Nanotechnology, Beijing National Laboratory for Molecular Sciences, Institute of Chemistry, Chinese Academy of Sciences, Beijing 100190, P. R. China</creatorcontrib><title>In situ AFM Investigation of Interfacial Morphology of Single Crystal Silicon Wafer Anode</title><title>Wuli huaxue xuebao</title><issn>1000-6818</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><recordid>eNpVkLFOwzAYhD2ARCk8AJtfIOW3ndjOGCpKI1qBVKrCFDmOHYxCXNkBKW9PKliYTrpPd8OH0A2BBZOc3z4_7heH9esdBZIRQhg9QzMCAAmXRF6gyxg_ABgQLmforexxdMMXLlZbXPbfJg6uVYPzPfZ2KgYTrNJOdXjrw_Hdd74dT2Tn-rYzeBnGOExw5zqnp81BWRNw0fvGXKFzq7porv9yjvar-5flOtk8PZTLYpNoKuWQUJUzkQNjIrU14Yw1oHKpIWvyOmtkqmkuBBdcMsp0RlVGswZSpWtBTWqlYHNEfn918DEGY6tjcJ8qjBWB6uSjmnxU_3ywH1gSVS8</recordid><startdate>20160115</startdate><enddate>20160115</enddate><creator>LIU, Xing-Rui</creator><creator>YAN, Hui-Juan</creator><creator>WANG, Dong</creator><creator>WAN, Li-Jun</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20160115</creationdate><title>In situ AFM Investigation of Interfacial Morphology of Single Crystal Silicon Wafer Anode</title><author>LIU, Xing-Rui ; YAN, Hui-Juan ; WANG, Dong ; WAN, Li-Jun</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c288t-2a937903374fb1633d0a98c05d9b5d84c29776768323c52a525d04acb72e4f873</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>chi ; eng</language><creationdate>2016</creationdate><toplevel>online_resources</toplevel><creatorcontrib>LIU, Xing-Rui</creatorcontrib><creatorcontrib>YAN, Hui-Juan</creatorcontrib><creatorcontrib>WANG, Dong</creatorcontrib><creatorcontrib>WAN, Li-Jun</creatorcontrib><creatorcontrib>中国科学院化学研究所，分子纳米结构与纳米技术实验室，北京分子科学国家实验室，北京 100190, CAS Key Laboratory of Molecular Nanostructure and Nanotechnology, Beijing National Laboratory for Molecular Sciences, Institute of Chemistry, Chinese Academy of Sciences, Beijing 100190, P. R. China</creatorcontrib><collection>CrossRef</collection><jtitle>Wuli huaxue xuebao</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>LIU, Xing-Rui</au><au>YAN, Hui-Juan</au><au>WANG, Dong</au><au>WAN, Li-Jun</au><aucorp>中国科学院化学研究所，分子纳米结构与纳米技术实验室，北京分子科学国家实验室，北京 100190, CAS Key Laboratory of Molecular Nanostructure and Nanotechnology, Beijing National Laboratory for Molecular Sciences, Institute of Chemistry, Chinese Academy of Sciences, Beijing 100190, P. R. China</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>In situ AFM Investigation of Interfacial Morphology of Single Crystal Silicon Wafer Anode</atitle><jtitle>Wuli huaxue xuebao</jtitle><date>2016-01-15</date><risdate>2016</risdate><volume>32</volume><issue>1</issue><spage>283</spage><epage>289</epage><pages>283-289</pages><issn>1000-6818</issn><doi>10.3866/PKU.WHXB201511132</doi><tpages>7</tpages><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier ISSN: 1000-6818
ispartof Wuli huaxue xuebao, 2016-01, Vol.32 (1), p.283-289
issn 1000-6818
language chi ; eng
recordid cdi_crossref_primary_10_3866_PKU_WHXB201511132
source Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals
title In situ AFM Investigation of Interfacial Morphology of Single Crystal Silicon Wafer Anode
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T02%3A57%3A06IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=In%20situ%20AFM%20Investigation%20of%20Interfacial%20Morphology%20of%20Single%20Crystal%20Silicon%20Wafer%20Anode&rft.jtitle=Wuli%20huaxue%20xuebao&rft.au=LIU,%20Xing-Rui&rft.aucorp=%E4%B8%AD%E5%9B%BD%E7%A7%91%E5%AD%A6%E9%99%A2%E5%8C%96%E5%AD%A6%E7%A0%94%E7%A9%B6%E6%89%80%EF%BC%8C%E5%88%86%E5%AD%90%E7%BA%B3%E7%B1%B3%E7%BB%93%E6%9E%84%E4%B8%8E%E7%BA%B3%E7%B1%B3%E6%8A%80%E6%9C%AF%E5%AE%9E%E9%AA%8C%E5%AE%A4%EF%BC%8C%E5%8C%97%E4%BA%AC%E5%88%86%E5%AD%90%E7%A7%91%E5%AD%A6%E5%9B%BD%E5%AE%B6%E5%AE%9E%E9%AA%8C%E5%AE%A4%EF%BC%8C%E5%8C%97%E4%BA%AC%20100190,%20CAS%20Key%20Laboratory%20of%20Molecular%20Nanostructure%20and%20Nanotechnology,%20Beijing%20National%20Laboratory%20for%20Molecular%20Sciences,%20Institute%20of%20Chemistry,%20Chinese%20Academy%20of%20Sciences,%20Beijing%20100190,%20P.%20R.%20China&rft.date=2016-01-15&rft.volume=32&rft.issue=1&rft.spage=283&rft.epage=289&rft.pages=283-289&rft.issn=1000-6818&rft_id=info:doi/10.3866/PKU.WHXB201511132&rft_dat=%3Ccrossref%3E10_3866_PKU_WHXB201511132%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true