Surface patterning of wide-gap semiconducting β-Ga 2 O 3 thin films by area selective crystallization via room-temperature excimer laser annealing and low toxic wet-etching processes

In the present study, we have developed a fully room-temperature and low toxic surface-patterning method for β-Ga 2 O 3 , where consists of the area selective laser-induced crystallization of amorphous Ga 2 O 3 thin films and acid-solution etching processes. Highly (−201)-oriented crystalline β-Ga 2...

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Veröffentlicht in:Applied physics express 2024-12
Hauptverfasser: Shiojiri, Daishi, Kai, Ryoya, Kaneko, Satoru, Matsuda, Aakifumi, Yoshimoto, Mamoru
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Kaneko, Satoru
Matsuda, Aakifumi
Yoshimoto, Mamoru
description In the present study, we have developed a fully room-temperature and low toxic surface-patterning method for β-Ga 2 O 3 , where consists of the area selective laser-induced crystallization of amorphous Ga 2 O 3 thin films and acid-solution etching processes. Highly (−201)-oriented crystalline β-Ga 2 O 3 thin films with ~70 nm thickness on α-Al 2 O 3 (0001) substrates were obtained by a combination of room-temperature deposition process and the subsequent excimer laser annealing at a deep-ultraviolet wavelength of 248 nm. In conclusion, the area selective crystallized β-Ga 2 O 3 micropatterns were obtained by ultrasonic wet etching with 40% H 3 PO 4 aqueous solution to remove amorphous regions.
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fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_35848_1882_0786_ada247</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_35848_1882_0786_ada247</sourcerecordid><originalsourceid>FETCH-crossref_primary_10_35848_1882_0786_ada2473</originalsourceid><addsrcrecordid>eNqdkElOxEAMRUsIJJrhAOx8gdCZSGqPGHYsYB-ZitNdqIbIVel0OBYbbsGZSAD1AdjYlv__-tIT4ipLr4sbWcp1JmWepLWs1thiXtZHYnV4HR_uWp6KsxDe0rQqi6xaic_ngTtUBD3GSOy024DvYNQtJRvsIZDVyrt2UHGRvj6SB4QcnqCAuNUOOm1sgNcJkAlnt6HZuCNQPIWIxuh3jNo72GkE9t4mkWxPjHFgAtorbYnBYJgnOkdolhZ0LRg_QvR7rWCkmFBU20Xp2SsKgcKFOOnQBLr82-ciu797uX1MFPsQmLqmZ22RpyZLmx9CzYKgWXA0v4SK_2S-AfPydN0</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Surface patterning of wide-gap semiconducting β-Ga 2 O 3 thin films by area selective crystallization via room-temperature excimer laser annealing and low toxic wet-etching processes</title><source>IOP Publishing Free Content</source><source>Institute of Physics Journals</source><source>DOAJ Directory of Open Access Journals</source><creator>Shiojiri, Daishi ; Kai, Ryoya ; Kaneko, Satoru ; Matsuda, Aakifumi ; Yoshimoto, Mamoru</creator><creatorcontrib>Shiojiri, Daishi ; Kai, Ryoya ; Kaneko, Satoru ; Matsuda, Aakifumi ; Yoshimoto, Mamoru</creatorcontrib><description>In the present study, we have developed a fully room-temperature and low toxic surface-patterning method for β-Ga 2 O 3 , where consists of the area selective laser-induced crystallization of amorphous Ga 2 O 3 thin films and acid-solution etching processes. Highly (−201)-oriented crystalline β-Ga 2 O 3 thin films with ~70 nm thickness on α-Al 2 O 3 (0001) substrates were obtained by a combination of room-temperature deposition process and the subsequent excimer laser annealing at a deep-ultraviolet wavelength of 248 nm. In conclusion, the area selective crystallized β-Ga 2 O 3 micropatterns were obtained by ultrasonic wet etching with 40% H 3 PO 4 aqueous solution to remove amorphous regions.</description><identifier>ISSN: 1882-0778</identifier><identifier>EISSN: 1882-0786</identifier><identifier>DOI: 10.35848/1882-0786/ada247</identifier><language>eng</language><ispartof>Applied physics express, 2024-12</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><orcidid>0000-0001-8161-8969</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,860,27901,27902</link.rule.ids></links><search><creatorcontrib>Shiojiri, Daishi</creatorcontrib><creatorcontrib>Kai, Ryoya</creatorcontrib><creatorcontrib>Kaneko, Satoru</creatorcontrib><creatorcontrib>Matsuda, Aakifumi</creatorcontrib><creatorcontrib>Yoshimoto, Mamoru</creatorcontrib><title>Surface patterning of wide-gap semiconducting β-Ga 2 O 3 thin films by area selective crystallization via room-temperature excimer laser annealing and low toxic wet-etching processes</title><title>Applied physics express</title><description>In the present study, we have developed a fully room-temperature and low toxic surface-patterning method for β-Ga 2 O 3 , where consists of the area selective laser-induced crystallization of amorphous Ga 2 O 3 thin films and acid-solution etching processes. Highly (−201)-oriented crystalline β-Ga 2 O 3 thin films with ~70 nm thickness on α-Al 2 O 3 (0001) substrates were obtained by a combination of room-temperature deposition process and the subsequent excimer laser annealing at a deep-ultraviolet wavelength of 248 nm. In conclusion, the area selective crystallized β-Ga 2 O 3 micropatterns were obtained by ultrasonic wet etching with 40% H 3 PO 4 aqueous solution to remove amorphous regions.</description><issn>1882-0778</issn><issn>1882-0786</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><recordid>eNqdkElOxEAMRUsIJJrhAOx8gdCZSGqPGHYsYB-ZitNdqIbIVel0OBYbbsGZSAD1AdjYlv__-tIT4ipLr4sbWcp1JmWepLWs1thiXtZHYnV4HR_uWp6KsxDe0rQqi6xaic_ngTtUBD3GSOy024DvYNQtJRvsIZDVyrt2UHGRvj6SB4QcnqCAuNUOOm1sgNcJkAlnt6HZuCNQPIWIxuh3jNo72GkE9t4mkWxPjHFgAtorbYnBYJgnOkdolhZ0LRg_QvR7rWCkmFBU20Xp2SsKgcKFOOnQBLr82-ciu797uX1MFPsQmLqmZ22RpyZLmx9CzYKgWXA0v4SK_2S-AfPydN0</recordid><startdate>20241220</startdate><enddate>20241220</enddate><creator>Shiojiri, Daishi</creator><creator>Kai, Ryoya</creator><creator>Kaneko, Satoru</creator><creator>Matsuda, Aakifumi</creator><creator>Yoshimoto, Mamoru</creator><scope>AAYXX</scope><scope>CITATION</scope><orcidid>https://orcid.org/0000-0001-8161-8969</orcidid></search><sort><creationdate>20241220</creationdate><title>Surface patterning of wide-gap semiconducting β-Ga 2 O 3 thin films by area selective crystallization via room-temperature excimer laser annealing and low toxic wet-etching processes</title><author>Shiojiri, Daishi ; Kai, Ryoya ; Kaneko, Satoru ; Matsuda, Aakifumi ; Yoshimoto, Mamoru</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-crossref_primary_10_35848_1882_0786_ada2473</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Shiojiri, Daishi</creatorcontrib><creatorcontrib>Kai, Ryoya</creatorcontrib><creatorcontrib>Kaneko, Satoru</creatorcontrib><creatorcontrib>Matsuda, Aakifumi</creatorcontrib><creatorcontrib>Yoshimoto, Mamoru</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics express</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Shiojiri, Daishi</au><au>Kai, Ryoya</au><au>Kaneko, Satoru</au><au>Matsuda, Aakifumi</au><au>Yoshimoto, Mamoru</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Surface patterning of wide-gap semiconducting β-Ga 2 O 3 thin films by area selective crystallization via room-temperature excimer laser annealing and low toxic wet-etching processes</atitle><jtitle>Applied physics express</jtitle><date>2024-12-20</date><risdate>2024</risdate><issn>1882-0778</issn><eissn>1882-0786</eissn><abstract>In the present study, we have developed a fully room-temperature and low toxic surface-patterning method for β-Ga 2 O 3 , where consists of the area selective laser-induced crystallization of amorphous Ga 2 O 3 thin films and acid-solution etching processes. Highly (−201)-oriented crystalline β-Ga 2 O 3 thin films with ~70 nm thickness on α-Al 2 O 3 (0001) substrates were obtained by a combination of room-temperature deposition process and the subsequent excimer laser annealing at a deep-ultraviolet wavelength of 248 nm. In conclusion, the area selective crystallized β-Ga 2 O 3 micropatterns were obtained by ultrasonic wet etching with 40% H 3 PO 4 aqueous solution to remove amorphous regions.</abstract><doi>10.35848/1882-0786/ada247</doi><orcidid>https://orcid.org/0000-0001-8161-8969</orcidid></addata></record>
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title Surface patterning of wide-gap semiconducting β-Ga 2 O 3 thin films by area selective crystallization via room-temperature excimer laser annealing and low toxic wet-etching processes
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-29T02%3A40%3A35IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Surface%20patterning%20of%20wide-gap%20semiconducting%20%CE%B2-Ga%202%20O%203%20thin%20films%20by%20area%20selective%20crystallization%20via%20room-temperature%20excimer%20laser%20annealing%20and%20low%20toxic%20wet-etching%20processes&rft.jtitle=Applied%20physics%20express&rft.au=Shiojiri,%20Daishi&rft.date=2024-12-20&rft.issn=1882-0778&rft.eissn=1882-0786&rft_id=info:doi/10.35848/1882-0786/ada247&rft_dat=%3Ccrossref%3E10_35848_1882_0786_ada247%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true