Extension of focal depth by electron quasi-Bessel beam in atomic-resolution scanning transmission electron microscopy

Extension of focal depth by electron quasi-Bessel beam in atomic-resolution scanning transmission electron microscopy

Extension of the focal depth of a sub-nanometer-sized electron probe in a scanning transmission electron microscope was demonstrated using an electron Bessel beam. We observed atomically-resolved annular dark-field scanning transmission electron microscope images of SrTiO 3 in the [001] direction wi...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Applied physics express 2022-11, Vol.15 (11), p.115001
Hauptverfasser: Ishida, Takafumi, Owaki, Takeshi, Ohtsuka, Masahiro, Kuwahara, Makoto, Saitoh, Koh, Kawasaki, Tadahiro
Format: Artikel
Sprache:eng
Schlagworte:
annular aperture
electron Bessel beam
scanning transmission electron microscopy
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue 11
container_start_page 115001
container_title Applied physics express
container_volume 15
creator Ishida, Takafumi
Owaki, Takeshi
Ohtsuka, Masahiro
Kuwahara, Makoto
Saitoh, Koh
Kawasaki, Tadahiro
description Extension of the focal depth of a sub-nanometer-sized electron probe in a scanning transmission electron microscope was demonstrated using an electron Bessel beam. We observed atomically-resolved annular dark-field scanning transmission electron microscope images of SrTiO 3 in the [001] direction with defocus using an electron quasi-Bessel beam generated by a ring-shaped aperture in an aberration-corrected probe-forming system. The experimental results show that the defocus range over which images with a 0.2 nm spatial resolution can be acquired using the electron quasi-Bessel beam is three times longer than the corresponding defocus range for a conventional beam.
doi_str_mv 10.35848/1882-0786/ac96ce
format Article
fullrecord <record><control><sourceid>iop_cross</sourceid><recordid>TN_cdi_crossref_primary_10_35848_1882_0786_ac96ce</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>apexac96ce</sourcerecordid><originalsourceid>FETCH-LOGICAL-c335t-a1b184107f0508dfd9361b9ccdd1408b4faaf7289c6cec68ec2ebb867ea7a09b3</originalsourceid><addsrcrecordid>eNp1kE1PwzAMhiMEEmPwA7jlyqEsWb_SI0zjQ5rEBc6RkzqQqU1K0krbv6fd0E4gWbIVv35iv4Tccnaf5iITCy7EMmGlKBagq0LjGZmdns5PdSkuyVWMW8aKLOXFjAzrXY8uWu-oN9R4DQ2tseu_qNpTbFD3YWx9DxBt8ogxYkMVQkuto9D71uokYPTN0E-EqME56z5pH8DF1sYD90QZ1cFH7bv9Nbkw0ES8-c1z8vG0fl-9JJu359fVwybRaZr3CXDFRcZZaVjORG3qKi24qrSua54xoTIDYMqlqPR4sC4E6iUqJYoSoQRWqXRO-JE7fRwDGtkF20LYS87kwTc5GSMnk-TRt3Hm7jhjfSe3fghu3FBChzvJc8n5GDljXHa1GbXJH9r_2T-10YHF</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Extension of focal depth by electron quasi-Bessel beam in atomic-resolution scanning transmission electron microscopy</title><source>Institute of Physics Journals</source><creator>Ishida, Takafumi ; Owaki, Takeshi ; Ohtsuka, Masahiro ; Kuwahara, Makoto ; Saitoh, Koh ; Kawasaki, Tadahiro</creator><creatorcontrib>Ishida, Takafumi ; Owaki, Takeshi ; Ohtsuka, Masahiro ; Kuwahara, Makoto ; Saitoh, Koh ; Kawasaki, Tadahiro</creatorcontrib><description>Extension of the focal depth of a sub-nanometer-sized electron probe in a scanning transmission electron microscope was demonstrated using an electron Bessel beam. We observed atomically-resolved annular dark-field scanning transmission electron microscope images of SrTiO 3 in the [001] direction with defocus using an electron quasi-Bessel beam generated by a ring-shaped aperture in an aberration-corrected probe-forming system. The experimental results show that the defocus range over which images with a 0.2 nm spatial resolution can be acquired using the electron quasi-Bessel beam is three times longer than the corresponding defocus range for a conventional beam.</description><identifier>ISSN: 1882-0778</identifier><identifier>EISSN: 1882-0786</identifier><identifier>DOI: 10.35848/1882-0786/ac96ce</identifier><identifier>CODEN: APEPC4</identifier><language>eng</language><publisher>IOP Publishing</publisher><subject>annular aperture ; electron Bessel beam ; scanning transmission electron microscopy</subject><ispartof>Applied physics express, 2022-11, Vol.15 (11), p.115001</ispartof><rights>2022 The Japan Society of Applied Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c335t-a1b184107f0508dfd9361b9ccdd1408b4faaf7289c6cec68ec2ebb867ea7a09b3</cites><orcidid>0000-0002-0141-3961</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.35848/1882-0786/ac96ce/pdf$$EPDF$$P50$$Giop$$H</linktopdf><link.rule.ids>314,776,780,27901,27902,53821,53868</link.rule.ids></links><search><creatorcontrib>Ishida, Takafumi</creatorcontrib><creatorcontrib>Owaki, Takeshi</creatorcontrib><creatorcontrib>Ohtsuka, Masahiro</creatorcontrib><creatorcontrib>Kuwahara, Makoto</creatorcontrib><creatorcontrib>Saitoh, Koh</creatorcontrib><creatorcontrib>Kawasaki, Tadahiro</creatorcontrib><title>Extension of focal depth by electron quasi-Bessel beam in atomic-resolution scanning transmission electron microscopy</title><title>Applied physics express</title><addtitle>Appl. Phys. Express</addtitle><description>Extension of the focal depth of a sub-nanometer-sized electron probe in a scanning transmission electron microscope was demonstrated using an electron Bessel beam. We observed atomically-resolved annular dark-field scanning transmission electron microscope images of SrTiO 3 in the [001] direction with defocus using an electron quasi-Bessel beam generated by a ring-shaped aperture in an aberration-corrected probe-forming system. The experimental results show that the defocus range over which images with a 0.2 nm spatial resolution can be acquired using the electron quasi-Bessel beam is three times longer than the corresponding defocus range for a conventional beam.</description><subject>annular aperture</subject><subject>electron Bessel beam</subject><subject>scanning transmission electron microscopy</subject><issn>1882-0778</issn><issn>1882-0786</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><recordid>eNp1kE1PwzAMhiMEEmPwA7jlyqEsWb_SI0zjQ5rEBc6RkzqQqU1K0krbv6fd0E4gWbIVv35iv4Tccnaf5iITCy7EMmGlKBagq0LjGZmdns5PdSkuyVWMW8aKLOXFjAzrXY8uWu-oN9R4DQ2tseu_qNpTbFD3YWx9DxBt8ogxYkMVQkuto9D71uokYPTN0E-EqME56z5pH8DF1sYD90QZ1cFH7bv9Nbkw0ES8-c1z8vG0fl-9JJu359fVwybRaZr3CXDFRcZZaVjORG3qKi24qrSua54xoTIDYMqlqPR4sC4E6iUqJYoSoQRWqXRO-JE7fRwDGtkF20LYS87kwTc5GSMnk-TRt3Hm7jhjfSe3fghu3FBChzvJc8n5GDljXHa1GbXJH9r_2T-10YHF</recordid><startdate>20221101</startdate><enddate>20221101</enddate><creator>Ishida, Takafumi</creator><creator>Owaki, Takeshi</creator><creator>Ohtsuka, Masahiro</creator><creator>Kuwahara, Makoto</creator><creator>Saitoh, Koh</creator><creator>Kawasaki, Tadahiro</creator><general>IOP Publishing</general><scope>AAYXX</scope><scope>CITATION</scope><orcidid>https://orcid.org/0000-0002-0141-3961</orcidid></search><sort><creationdate>20221101</creationdate><title>Extension of focal depth by electron quasi-Bessel beam in atomic-resolution scanning transmission electron microscopy</title><author>Ishida, Takafumi ; Owaki, Takeshi ; Ohtsuka, Masahiro ; Kuwahara, Makoto ; Saitoh, Koh ; Kawasaki, Tadahiro</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c335t-a1b184107f0508dfd9361b9ccdd1408b4faaf7289c6cec68ec2ebb867ea7a09b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>annular aperture</topic><topic>electron Bessel beam</topic><topic>scanning transmission electron microscopy</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ishida, Takafumi</creatorcontrib><creatorcontrib>Owaki, Takeshi</creatorcontrib><creatorcontrib>Ohtsuka, Masahiro</creatorcontrib><creatorcontrib>Kuwahara, Makoto</creatorcontrib><creatorcontrib>Saitoh, Koh</creatorcontrib><creatorcontrib>Kawasaki, Tadahiro</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics express</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ishida, Takafumi</au><au>Owaki, Takeshi</au><au>Ohtsuka, Masahiro</au><au>Kuwahara, Makoto</au><au>Saitoh, Koh</au><au>Kawasaki, Tadahiro</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Extension of focal depth by electron quasi-Bessel beam in atomic-resolution scanning transmission electron microscopy</atitle><jtitle>Applied physics express</jtitle><addtitle>Appl. Phys. Express</addtitle><date>2022-11-01</date><risdate>2022</risdate><volume>15</volume><issue>11</issue><spage>115001</spage><pages>115001-</pages><issn>1882-0778</issn><eissn>1882-0786</eissn><coden>APEPC4</coden><abstract>Extension of the focal depth of a sub-nanometer-sized electron probe in a scanning transmission electron microscope was demonstrated using an electron Bessel beam. We observed atomically-resolved annular dark-field scanning transmission electron microscope images of SrTiO 3 in the [001] direction with defocus using an electron quasi-Bessel beam generated by a ring-shaped aperture in an aberration-corrected probe-forming system. The experimental results show that the defocus range over which images with a 0.2 nm spatial resolution can be acquired using the electron quasi-Bessel beam is three times longer than the corresponding defocus range for a conventional beam.</abstract><pub>IOP Publishing</pub><doi>10.35848/1882-0786/ac96ce</doi><tpages>5</tpages><orcidid>https://orcid.org/0000-0002-0141-3961</orcidid></addata></record>
fulltext fulltext
identifier ISSN: 1882-0778
ispartof Applied physics express, 2022-11, Vol.15 (11), p.115001
issn 1882-0778
1882-0786
language eng
recordid cdi_crossref_primary_10_35848_1882_0786_ac96ce
source Institute of Physics Journals
subjects annular aperture
electron Bessel beam
scanning transmission electron microscopy
title Extension of focal depth by electron quasi-Bessel beam in atomic-resolution scanning transmission electron microscopy
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-08T02%3A43%3A06IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-iop_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Extension%20of%20focal%20depth%20by%20electron%20quasi-Bessel%20beam%20in%20atomic-resolution%20scanning%20transmission%20electron%20microscopy&rft.jtitle=Applied%20physics%20express&rft.au=Ishida,%20Takafumi&rft.date=2022-11-01&rft.volume=15&rft.issue=11&rft.spage=115001&rft.pages=115001-&rft.issn=1882-0778&rft.eissn=1882-0786&rft.coden=APEPC4&rft_id=info:doi/10.35848/1882-0786/ac96ce&rft_dat=%3Ciop_cross%3Eapexac96ce%3C/iop_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true