Structural phase transition and negative thermal expansion in Cu 1.8 Zn 0.2 V 2–x P x O 7 solid solutions

Structural phase transition and negative thermal expansion in Cu 1.8 Zn 0.2 V 2–x P x O 7 solid solutions

Negative thermal expansion (NTE) is exhibited over the entire x range for Cu 1.8 Zn 0.2 V 2– x P x O 7 . In particular, dilatometric measurements using epoxy resin matrix composites containing the spray-dried powder demonstrated that the thermal expansion suppressive capability was almost unchanged...

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Veröffentlicht in:Applied physics express 2022-02, Vol.15 (2), p.25504
Hauptverfasser: Takenaka, Koshi, Kano, Masato, Kasugai, Ryota, Takada, Kohei, Eto, Koki, Kadowaki, Yoshifumi, Yokoyama, Yasunori, Katayama, Naoyuki, Okamoto, Yoshihiko
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container_issue 2
container_start_page 25504
container_title Applied physics express
container_volume 15
creator Takenaka, Koshi
Kano, Masato
Kasugai, Ryota
Takada, Kohei
Eto, Koki
Kadowaki, Yoshifumi
Yokoyama, Yasunori
Katayama, Naoyuki
Okamoto, Yoshihiko
description Negative thermal expansion (NTE) is exhibited over the entire x range for Cu 1.8 Zn 0.2 V 2– x P x O 7 . In particular, dilatometric measurements using epoxy resin matrix composites containing the spray-dried powder demonstrated that the thermal expansion suppressive capability was almost unchanged for x ≤ 1.0. With increasing x , the X-ray diffraction peak position moves systematically, but some peaks are extremely broad and/or asymmetric, suggesting disorder in the internal structure. The crystallographic analysis confirmed NTE enhancement by microstructural effects at least for x  = 0.2. Preliminary measurements suggest higher resistivity and lower dielectric constant than that of pure vanadate, which is suitable for application to electronic devices.
doi_str_mv 10.35848/1882-0786/ac4926
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fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_35848_1882_0786_ac4926</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_35848_1882_0786_ac4926</sourcerecordid><originalsourceid>FETCH-LOGICAL-c906-b5efc8bd9a6e2cfa9b649127e3990e0c7eccf8d79937a22acda3939b584e9a123</originalsourceid><addsrcrecordid>eNo9kM1Kw0AUhQdRsFYfwN19gaTzk87PUoI_hUIFiws34WYysdE2DTOJxJ3v4Bv6JCZWujn3cO7hLD5CrhmNxVwnesa05hFVWs7QJobLEzI5RqdHr_Q5uQjhjVKZCCYn5P2p9Z1tO49baDYYHLQe61C11b4GrAuo3Su21ceQb5zfDS3XN2NheFc1pB2wWMNLDTTm8Az85-u7h0foYQUKwn5bFaN241y4JGclboO7-r9Tsr67XacP0XJ1v0hvlpE1VEb53JVW54VB6bgt0eQyMYwrJ4yhjlrlrC11oYwRCjlHW6AwwuQDBWeQcTEl7DBr_T4E78qs8dUO_WfGaPYHKxtpZCOZ7ABL_AK4tF35</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Structural phase transition and negative thermal expansion in Cu 1.8 Zn 0.2 V 2–x P x O 7 solid solutions</title><source>IOP Publishing Journals</source><source>Institute of Physics (IOP) Journals - HEAL-Link</source><creator>Takenaka, Koshi ; Kano, Masato ; Kasugai, Ryota ; Takada, Kohei ; Eto, Koki ; Kadowaki, Yoshifumi ; Yokoyama, Yasunori ; Katayama, Naoyuki ; Okamoto, Yoshihiko</creator><creatorcontrib>Takenaka, Koshi ; Kano, Masato ; Kasugai, Ryota ; Takada, Kohei ; Eto, Koki ; Kadowaki, Yoshifumi ; Yokoyama, Yasunori ; Katayama, Naoyuki ; Okamoto, Yoshihiko</creatorcontrib><description>Negative thermal expansion (NTE) is exhibited over the entire x range for Cu 1.8 Zn 0.2 V 2– x P x O 7 . In particular, dilatometric measurements using epoxy resin matrix composites containing the spray-dried powder demonstrated that the thermal expansion suppressive capability was almost unchanged for x ≤ 1.0. With increasing x , the X-ray diffraction peak position moves systematically, but some peaks are extremely broad and/or asymmetric, suggesting disorder in the internal structure. The crystallographic analysis confirmed NTE enhancement by microstructural effects at least for x  = 0.2. Preliminary measurements suggest higher resistivity and lower dielectric constant than that of pure vanadate, which is suitable for application to electronic devices.</description><identifier>ISSN: 1882-0778</identifier><identifier>EISSN: 1882-0786</identifier><identifier>DOI: 10.35848/1882-0786/ac4926</identifier><language>eng</language><ispartof>Applied physics express, 2022-02, Vol.15 (2), p.25504</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c906-b5efc8bd9a6e2cfa9b649127e3990e0c7eccf8d79937a22acda3939b584e9a123</citedby><cites>FETCH-LOGICAL-c906-b5efc8bd9a6e2cfa9b649127e3990e0c7eccf8d79937a22acda3939b584e9a123</cites><orcidid>0000-0003-4468-0522 ; 0000-0003-3206-1919 ; 0000-0002-0753-9784 ; 0000-0002-6884-9022 ; 0000-0002-9357-9140</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,778,782,27907,27908</link.rule.ids></links><search><creatorcontrib>Takenaka, Koshi</creatorcontrib><creatorcontrib>Kano, Masato</creatorcontrib><creatorcontrib>Kasugai, Ryota</creatorcontrib><creatorcontrib>Takada, Kohei</creatorcontrib><creatorcontrib>Eto, Koki</creatorcontrib><creatorcontrib>Kadowaki, Yoshifumi</creatorcontrib><creatorcontrib>Yokoyama, Yasunori</creatorcontrib><creatorcontrib>Katayama, Naoyuki</creatorcontrib><creatorcontrib>Okamoto, Yoshihiko</creatorcontrib><title>Structural phase transition and negative thermal expansion in Cu 1.8 Zn 0.2 V 2–x P x O 7 solid solutions</title><title>Applied physics express</title><description>Negative thermal expansion (NTE) is exhibited over the entire x range for Cu 1.8 Zn 0.2 V 2– x P x O 7 . In particular, dilatometric measurements using epoxy resin matrix composites containing the spray-dried powder demonstrated that the thermal expansion suppressive capability was almost unchanged for x ≤ 1.0. With increasing x , the X-ray diffraction peak position moves systematically, but some peaks are extremely broad and/or asymmetric, suggesting disorder in the internal structure. The crystallographic analysis confirmed NTE enhancement by microstructural effects at least for x  = 0.2. Preliminary measurements suggest higher resistivity and lower dielectric constant than that of pure vanadate, which is suitable for application to electronic devices.</description><issn>1882-0778</issn><issn>1882-0786</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><recordid>eNo9kM1Kw0AUhQdRsFYfwN19gaTzk87PUoI_hUIFiws34WYysdE2DTOJxJ3v4Bv6JCZWujn3cO7hLD5CrhmNxVwnesa05hFVWs7QJobLEzI5RqdHr_Q5uQjhjVKZCCYn5P2p9Z1tO49baDYYHLQe61C11b4GrAuo3Su21ceQb5zfDS3XN2NheFc1pB2wWMNLDTTm8Az85-u7h0foYQUKwn5bFaN241y4JGclboO7-r9Tsr67XacP0XJ1v0hvlpE1VEb53JVW54VB6bgt0eQyMYwrJ4yhjlrlrC11oYwRCjlHW6AwwuQDBWeQcTEl7DBr_T4E78qs8dUO_WfGaPYHKxtpZCOZ7ABL_AK4tF35</recordid><startdate>20220201</startdate><enddate>20220201</enddate><creator>Takenaka, Koshi</creator><creator>Kano, Masato</creator><creator>Kasugai, Ryota</creator><creator>Takada, Kohei</creator><creator>Eto, Koki</creator><creator>Kadowaki, Yoshifumi</creator><creator>Yokoyama, Yasunori</creator><creator>Katayama, Naoyuki</creator><creator>Okamoto, Yoshihiko</creator><scope>AAYXX</scope><scope>CITATION</scope><orcidid>https://orcid.org/0000-0003-4468-0522</orcidid><orcidid>https://orcid.org/0000-0003-3206-1919</orcidid><orcidid>https://orcid.org/0000-0002-0753-9784</orcidid><orcidid>https://orcid.org/0000-0002-6884-9022</orcidid><orcidid>https://orcid.org/0000-0002-9357-9140</orcidid></search><sort><creationdate>20220201</creationdate><title>Structural phase transition and negative thermal expansion in Cu 1.8 Zn 0.2 V 2–x P x O 7 solid solutions</title><author>Takenaka, Koshi ; Kano, Masato ; Kasugai, Ryota ; Takada, Kohei ; Eto, Koki ; Kadowaki, Yoshifumi ; Yokoyama, Yasunori ; Katayama, Naoyuki ; Okamoto, Yoshihiko</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c906-b5efc8bd9a6e2cfa9b649127e3990e0c7eccf8d79937a22acda3939b584e9a123</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Takenaka, Koshi</creatorcontrib><creatorcontrib>Kano, Masato</creatorcontrib><creatorcontrib>Kasugai, Ryota</creatorcontrib><creatorcontrib>Takada, Kohei</creatorcontrib><creatorcontrib>Eto, Koki</creatorcontrib><creatorcontrib>Kadowaki, Yoshifumi</creatorcontrib><creatorcontrib>Yokoyama, Yasunori</creatorcontrib><creatorcontrib>Katayama, Naoyuki</creatorcontrib><creatorcontrib>Okamoto, Yoshihiko</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics express</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Takenaka, Koshi</au><au>Kano, Masato</au><au>Kasugai, Ryota</au><au>Takada, Kohei</au><au>Eto, Koki</au><au>Kadowaki, Yoshifumi</au><au>Yokoyama, Yasunori</au><au>Katayama, Naoyuki</au><au>Okamoto, Yoshihiko</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Structural phase transition and negative thermal expansion in Cu 1.8 Zn 0.2 V 2–x P x O 7 solid solutions</atitle><jtitle>Applied physics express</jtitle><date>2022-02-01</date><risdate>2022</risdate><volume>15</volume><issue>2</issue><spage>25504</spage><pages>25504-</pages><issn>1882-0778</issn><eissn>1882-0786</eissn><abstract>Negative thermal expansion (NTE) is exhibited over the entire x range for Cu 1.8 Zn 0.2 V 2– x P x O 7 . In particular, dilatometric measurements using epoxy resin matrix composites containing the spray-dried powder demonstrated that the thermal expansion suppressive capability was almost unchanged for x ≤ 1.0. With increasing x , the X-ray diffraction peak position moves systematically, but some peaks are extremely broad and/or asymmetric, suggesting disorder in the internal structure. The crystallographic analysis confirmed NTE enhancement by microstructural effects at least for x  = 0.2. Preliminary measurements suggest higher resistivity and lower dielectric constant than that of pure vanadate, which is suitable for application to electronic devices.</abstract><doi>10.35848/1882-0786/ac4926</doi><orcidid>https://orcid.org/0000-0003-4468-0522</orcidid><orcidid>https://orcid.org/0000-0003-3206-1919</orcidid><orcidid>https://orcid.org/0000-0002-0753-9784</orcidid><orcidid>https://orcid.org/0000-0002-6884-9022</orcidid><orcidid>https://orcid.org/0000-0002-9357-9140</orcidid></addata></record>
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title Structural phase transition and negative thermal expansion in Cu 1.8 Zn 0.2 V 2–x P x O 7 solid solutions
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-16T15%3A28%3A44IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Structural%20phase%20transition%20and%20negative%20thermal%20expansion%20in%20Cu%201.8%20Zn%200.2%20V%202%E2%80%93x%20P%20x%20O%207%20solid%20solutions&rft.jtitle=Applied%20physics%20express&rft.au=Takenaka,%20Koshi&rft.date=2022-02-01&rft.volume=15&rft.issue=2&rft.spage=25504&rft.pages=25504-&rft.issn=1882-0778&rft.eissn=1882-0786&rft_id=info:doi/10.35848/1882-0786/ac4926&rft_dat=%3Ccrossref%3E10_35848_1882_0786_ac4926%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true