Evaluation of a back-illuminated solid state detector with thin dead layer for super heavy element research

The precise energy measurement of charged particles using a silicon semiconductor detector (SSD) is very important in studies of the characteristics of superheavy elements (SHEs). It is necessary to evaluate the dead layer thickness of the SSD to measure the recoil energy of charged particles, such...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Japanese Journal of Applied Physics 2020-06, Vol.59 (6), p.66004
Hauptverfasser:	Numakura, Hayato, Morimoto, Kouji, Kaji, Daiya, Kosugi, Kazumasa, Horikawa, Chikako, Ishizawa, Satoshi, Takeyama, Mirei, Tokanai, Fuyuki
Format:	Artikel
Sprache:	eng
Schlagworte:	Dead layer SHE SSD
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!