Low-frequency noises in the metal-semiconductor contact

CVC and low-frequency noises of metal-semiconductor structures were investigated at the room temperature. CVC and low-frequency noise spectra of the diode structures with the Schottky barrier based on the Fe/ n -Si, Cr/ n -Si and W/ n -Si are obtained. It is shown that the CVC, the noise level and i...

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Veröffentlicht in:Journal of contemporary physics 2015-04, Vol.50 (2), p.170-176
Hauptverfasser: Khondkaryan, H. D., Gasparyan, F. V.
Format: Artikel
Sprache:eng
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