Experimental Study of Radiation-Induced Evaporation of Cesium Iodide on VEPP-3 Synchrotron Radiation Source
The thickness and structure of scintillation screens are of paramount importance in X-ray microscopy. A scintillator should be fairly thick in order to maximize the conversion of X-ray quanta to the visible range. At the same time, scattering of light in scintillators considerably reduces the spatia...
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Veröffentlicht in: | Bulletin of the Russian Academy of Sciences. Physics 2019-02, Vol.83 (2), p.225-227 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The thickness and structure of scintillation screens are of paramount importance in X-ray microscopy. A scintillator should be fairly thick in order to maximize the conversion of X-ray quanta to the visible range. At the same time, scattering of light in scintillators considerably reduces the spatial resolution of X-ray images. To improve resolution, the CsI:Tl layer can be structured as a matrix of micropixels to inhibit the spread of light to neighboring cells. In this work, radiation-induced ablation of CsI:Tl with the use of synchrotron radiation is examined as a new way of structuring for scintillation screens. |
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ISSN: | 1062-8738 1934-9432 |
DOI: | 10.3103/S1062873819020205 |