Preparation and Characterization of SiO2 Thin Films as an Antireflective Layer
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| Veröffentlicht in: | Diyala Journal For Pure Science 2018-01, Vol.14 (1), p.68-77 |
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| Sprache: | eng |
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| container_end_page | 77 |
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| container_issue | 1 |
| container_start_page | 68 |
| container_title | Diyala Journal For Pure Science |
| container_volume | 14 |
| creator | Salih, Ammar T. Gbashi, Kadhim Kadhem, Tawfeeq |
| description | |
| doi_str_mv | 10.24237/djps.1401.331C |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 2222-8373 |
| ispartof | Diyala Journal For Pure Science, 2018-01, Vol.14 (1), p.68-77 |
| issn | 2222-8373 |
| language | eng |
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| source | Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals |
| title | Preparation and Characterization of SiO2 Thin Films as an Antireflective Layer |
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