A New Type of Interference Fringes Observed in Electron-micrograph of Crystalline Substance

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Proceedings of the Japan Academy 1951, Vol.27 (2), p.86-87
Hauptverfasser: MITSUISHI, Tomokuni, NAGASAKI, Hiroo, UYEDA, Ryozi
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 87
container_issue 2
container_start_page 86
container_title Proceedings of the Japan Academy
container_volume 27
creator MITSUISHI, Tomokuni
NAGASAKI, Hiroo
UYEDA, Ryozi
description
doi_str_mv 10.2183/pjab1945.27.86
format Article
fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_2183_pjab1945_27_86</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_2183_pjab1945_27_86</sourcerecordid><originalsourceid>FETCH-LOGICAL-c2476-d9c8f8eca3e0716782a2d3810c22a5084ad7351162d1b19f7322a9f45d99b3593</originalsourceid><addsrcrecordid>eNo1UM1OwzAYywEkxuDKOS_Q8iVpfnqcqg0mTezAOHGo0vTL6NS1VVJAfXs6ASdblmzZJuSBQcqZEY_DyVYsz2TKdWrUFVkAcJZk3MANuY3xBCBBgFqQ9xV9wW96mAakvafbbsTgMWDnkG5C0x0x0n0VMXxhTZuOrlt0Y-i75Ny40B-DHT4uviJMcbRt23RIXz-rmc8Bd-Ta2zbi_R8uydtmfSiek93-aVusdonjmVZJnTvjDTorEDRT2nDLa2EYOM6tBJPZWgvJmOI1m0d5LWY995ms87wSMhdLkv7mzo1iDOjLITRnG6aSQXm5o_y_o-S6NEr8ANbBVZ8</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>A New Type of Interference Fringes Observed in Electron-micrograph of Crystalline Substance</title><source>J-STAGE Free</source><source>Project Euclid Open Access</source><creator>MITSUISHI, Tomokuni ; NAGASAKI, Hiroo ; UYEDA, Ryozi</creator><creatorcontrib>MITSUISHI, Tomokuni ; NAGASAKI, Hiroo ; UYEDA, Ryozi</creatorcontrib><identifier>ISSN: 0021-4280</identifier><identifier>DOI: 10.2183/pjab1945.27.86</identifier><language>eng</language><ispartof>Proceedings of the Japan Academy, 1951, Vol.27 (2), p.86-87</ispartof><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c2476-d9c8f8eca3e0716782a2d3810c22a5084ad7351162d1b19f7322a9f45d99b3593</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,778,782,4012,27906,27907,27908</link.rule.ids></links><search><creatorcontrib>MITSUISHI, Tomokuni</creatorcontrib><creatorcontrib>NAGASAKI, Hiroo</creatorcontrib><creatorcontrib>UYEDA, Ryozi</creatorcontrib><title>A New Type of Interference Fringes Observed in Electron-micrograph of Crystalline Substance</title><title>Proceedings of the Japan Academy</title><issn>0021-4280</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1951</creationdate><recordtype>article</recordtype><recordid>eNo1UM1OwzAYywEkxuDKOS_Q8iVpfnqcqg0mTezAOHGo0vTL6NS1VVJAfXs6ASdblmzZJuSBQcqZEY_DyVYsz2TKdWrUFVkAcJZk3MANuY3xBCBBgFqQ9xV9wW96mAakvafbbsTgMWDnkG5C0x0x0n0VMXxhTZuOrlt0Y-i75Ny40B-DHT4uviJMcbRt23RIXz-rmc8Bd-Ta2zbi_R8uydtmfSiek93-aVusdonjmVZJnTvjDTorEDRT2nDLa2EYOM6tBJPZWgvJmOI1m0d5LWY995ms87wSMhdLkv7mzo1iDOjLITRnG6aSQXm5o_y_o-S6NEr8ANbBVZ8</recordid><startdate>1951</startdate><enddate>1951</enddate><creator>MITSUISHI, Tomokuni</creator><creator>NAGASAKI, Hiroo</creator><creator>UYEDA, Ryozi</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>1951</creationdate><title>A New Type of Interference Fringes Observed in Electron-micrograph of Crystalline Substance</title><author>MITSUISHI, Tomokuni ; NAGASAKI, Hiroo ; UYEDA, Ryozi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2476-d9c8f8eca3e0716782a2d3810c22a5084ad7351162d1b19f7322a9f45d99b3593</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1951</creationdate><toplevel>online_resources</toplevel><creatorcontrib>MITSUISHI, Tomokuni</creatorcontrib><creatorcontrib>NAGASAKI, Hiroo</creatorcontrib><creatorcontrib>UYEDA, Ryozi</creatorcontrib><collection>CrossRef</collection><jtitle>Proceedings of the Japan Academy</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>MITSUISHI, Tomokuni</au><au>NAGASAKI, Hiroo</au><au>UYEDA, Ryozi</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A New Type of Interference Fringes Observed in Electron-micrograph of Crystalline Substance</atitle><jtitle>Proceedings of the Japan Academy</jtitle><date>1951</date><risdate>1951</risdate><volume>27</volume><issue>2</issue><spage>86</spage><epage>87</epage><pages>86-87</pages><issn>0021-4280</issn><doi>10.2183/pjab1945.27.86</doi><tpages>2</tpages><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier ISSN: 0021-4280
ispartof Proceedings of the Japan Academy, 1951, Vol.27 (2), p.86-87
issn 0021-4280
language eng
recordid cdi_crossref_primary_10_2183_pjab1945_27_86
source J-STAGE Free; Project Euclid Open Access
title A New Type of Interference Fringes Observed in Electron-micrograph of Crystalline Substance
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-17T04%3A49%3A12IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%20New%20Type%20of%20Interference%20Fringes%20Observed%20in%20Electron-micrograph%20of%20Crystalline%20Substance&rft.jtitle=Proceedings%20of%20the%20Japan%20Academy&rft.au=MITSUISHI,%20Tomokuni&rft.date=1951&rft.volume=27&rft.issue=2&rft.spage=86&rft.epage=87&rft.pages=86-87&rft.issn=0021-4280&rft_id=info:doi/10.2183/pjab1945.27.86&rft_dat=%3Ccrossref%3E10_2183_pjab1945_27_86%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true