The Properties of Shuffle Screw Dislocations in Semiconductors Silicon and Germanium

The dislocation widths, Peierls barriers and Peierls stresses for shuffle screw dislocations in diamond structure crystals, Si and Ge, have been calculated by the improved P-N theory. The widths are about 0.6b, where b is the Burgers vector. The Peierls barrier for shuffle screw dislocation in Si an...

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Veröffentlicht in:The open materials science journal 2015-05, Vol.9 (1), p.10-13
Hauptverfasser: Zhang, Huili, Zhang, Chun, Zeng, Chunhua, Tong, Lumei
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Tong, Lumei
description The dislocation widths, Peierls barriers and Peierls stresses for shuffle screw dislocations in diamond structure crystals, Si and Ge, have been calculated by the improved P-N theory. The widths are about 0.6b, where b is the Burgers vector. The Peierls barrier for shuffle screw dislocation in Si and Ge, is about 3.61~4.61meV/Å and 5.31~13.32meV/Å, respectively. The Peierls stress is about 0.28~0.33GPa and 0.31~0.53GPa, respectively. The calculated Peierls barriers and stresses are likely the results of shuffle screw dislocation with metastable core which is centered on the bond between two atoms.
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fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_2174_1874088X01509010010</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_2174_1874088X01509010010</sourcerecordid><originalsourceid>FETCH-LOGICAL-c1390-81359a4ca9fc0e57221950ea1729e5524ba066afef76ad0802da426ecb08d5173</originalsourceid><addsrcrecordid>eNptkEFLxDAUhIMouK7-Ai_5A9X30qZpjrLqrrCg0AreSjZ9YSNtsyRdxH-vRQ8ehIGZ-Q5zGMauEW4EquIWK1VAVb0BStCA8K0TtphpNuPTP_mcXaT0DlAKrXDBmmZP_CWGA8XJU-LB8Xp_dK4nXttIH_zepz5YM_kwJu5HXtPgbRi7o51CTLz2_Vy5GTu-pjiY0R-HS3bmTJ_o6teX7PXxoVltsu3z-ml1t80s5hqyCnOpTWGNdhZIKiFQSyCDSmiSUhQ7A2VpHDlVmg4qEJ0pREl2B1UnUeVLlv_s2hhSiuTaQ_SDiZ8tQjsf0_5zTP4FTdZWdA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>The Properties of Shuffle Screw Dislocations in Semiconductors Silicon and Germanium</title><source>Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals</source><source>Free Full-Text Journals in Chemistry</source><creator>Zhang, Huili ; Zhang, Chun ; Zeng, Chunhua ; Tong, Lumei</creator><creatorcontrib>Zhang, Huili ; Zhang, Chun ; Zeng, Chunhua ; Tong, Lumei</creatorcontrib><description>The dislocation widths, Peierls barriers and Peierls stresses for shuffle screw dislocations in diamond structure crystals, Si and Ge, have been calculated by the improved P-N theory. The widths are about 0.6b, where b is the Burgers vector. The Peierls barrier for shuffle screw dislocation in Si and Ge, is about 3.61~4.61meV/Å and 5.31~13.32meV/Å, respectively. The Peierls stress is about 0.28~0.33GPa and 0.31~0.53GPa, respectively. The calculated Peierls barriers and stresses are likely the results of shuffle screw dislocation with metastable core which is centered on the bond between two atoms.</description><identifier>ISSN: 1874-088X</identifier><identifier>EISSN: 1874-088X</identifier><identifier>DOI: 10.2174/1874088X01509010010</identifier><language>eng</language><ispartof>The open materials science journal, 2015-05, Vol.9 (1), p.10-13</ispartof><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c1390-81359a4ca9fc0e57221950ea1729e5524ba066afef76ad0802da426ecb08d5173</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids></links><search><creatorcontrib>Zhang, Huili</creatorcontrib><creatorcontrib>Zhang, Chun</creatorcontrib><creatorcontrib>Zeng, Chunhua</creatorcontrib><creatorcontrib>Tong, Lumei</creatorcontrib><title>The Properties of Shuffle Screw Dislocations in Semiconductors Silicon and Germanium</title><title>The open materials science journal</title><description>The dislocation widths, Peierls barriers and Peierls stresses for shuffle screw dislocations in diamond structure crystals, Si and Ge, have been calculated by the improved P-N theory. The widths are about 0.6b, where b is the Burgers vector. The Peierls barrier for shuffle screw dislocation in Si and Ge, is about 3.61~4.61meV/Å and 5.31~13.32meV/Å, respectively. The Peierls stress is about 0.28~0.33GPa and 0.31~0.53GPa, respectively. The calculated Peierls barriers and stresses are likely the results of shuffle screw dislocation with metastable core which is centered on the bond between two atoms.</description><issn>1874-088X</issn><issn>1874-088X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><recordid>eNptkEFLxDAUhIMouK7-Ai_5A9X30qZpjrLqrrCg0AreSjZ9YSNtsyRdxH-vRQ8ehIGZ-Q5zGMauEW4EquIWK1VAVb0BStCA8K0TtphpNuPTP_mcXaT0DlAKrXDBmmZP_CWGA8XJU-LB8Xp_dK4nXttIH_zepz5YM_kwJu5HXtPgbRi7o51CTLz2_Vy5GTu-pjiY0R-HS3bmTJ_o6teX7PXxoVltsu3z-ml1t80s5hqyCnOpTWGNdhZIKiFQSyCDSmiSUhQ7A2VpHDlVmg4qEJ0pREl2B1UnUeVLlv_s2hhSiuTaQ_SDiZ8tQjsf0_5zTP4FTdZWdA</recordid><startdate>20150529</startdate><enddate>20150529</enddate><creator>Zhang, Huili</creator><creator>Zhang, Chun</creator><creator>Zeng, Chunhua</creator><creator>Tong, Lumei</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20150529</creationdate><title>The Properties of Shuffle Screw Dislocations in Semiconductors Silicon and Germanium</title><author>Zhang, Huili ; Zhang, Chun ; Zeng, Chunhua ; Tong, Lumei</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1390-81359a4ca9fc0e57221950ea1729e5524ba066afef76ad0802da426ecb08d5173</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zhang, Huili</creatorcontrib><creatorcontrib>Zhang, Chun</creatorcontrib><creatorcontrib>Zeng, Chunhua</creatorcontrib><creatorcontrib>Tong, Lumei</creatorcontrib><collection>CrossRef</collection><jtitle>The open materials science journal</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zhang, Huili</au><au>Zhang, Chun</au><au>Zeng, Chunhua</au><au>Tong, Lumei</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The Properties of Shuffle Screw Dislocations in Semiconductors Silicon and Germanium</atitle><jtitle>The open materials science journal</jtitle><date>2015-05-29</date><risdate>2015</risdate><volume>9</volume><issue>1</issue><spage>10</spage><epage>13</epage><pages>10-13</pages><issn>1874-088X</issn><eissn>1874-088X</eissn><abstract>The dislocation widths, Peierls barriers and Peierls stresses for shuffle screw dislocations in diamond structure crystals, Si and Ge, have been calculated by the improved P-N theory. The widths are about 0.6b, where b is the Burgers vector. The Peierls barrier for shuffle screw dislocation in Si and Ge, is about 3.61~4.61meV/Å and 5.31~13.32meV/Å, respectively. The Peierls stress is about 0.28~0.33GPa and 0.31~0.53GPa, respectively. The calculated Peierls barriers and stresses are likely the results of shuffle screw dislocation with metastable core which is centered on the bond between two atoms.</abstract><doi>10.2174/1874088X01509010010</doi><tpages>4</tpages><oa>free_for_read</oa></addata></record>
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url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-09T00%3A14%3A02IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=The%20Properties%20of%20Shuffle%20Screw%20Dislocations%20in%20Semiconductors%20Silicon%20and%20Germanium&rft.jtitle=The%20open%20materials%20science%20journal&rft.au=Zhang,%20Huili&rft.date=2015-05-29&rft.volume=9&rft.issue=1&rft.spage=10&rft.epage=13&rft.pages=10-13&rft.issn=1874-088X&rft.eissn=1874-088X&rft_id=info:doi/10.2174/1874088X01509010010&rft_dat=%3Ccrossref%3E10_2174_1874088X01509010010%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true