Revealing the Instantaneous Machining Gap Produced During wire Electrochemical Micromachining Using Electrochemical Deposition

Wire electrochemical micromachining (WECMM) has increasingly been recognized as a promising method in producing micro-components. Research into the machining gap is of great importance for understanding the regularities of WECMM. However, studies published on the machining gap are usually approximat...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:International journal of electrochemical science 2020-11, Vol.15 (11), p.11080-11091
Hauptverfasser: Bi, Xiaolei, Zeng, Yongbin
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 11091
container_issue 11
container_start_page 11080
container_title International journal of electrochemical science
container_volume 15
creator Bi, Xiaolei
Zeng, Yongbin
description Wire electrochemical micromachining (WECMM) has increasingly been recognized as a promising method in producing micro-components. Research into the machining gap is of great importance for understanding the regularities of WECMM. However, studies published on the machining gap are usually approximate and simplified because it is difficult to observe and measure the formation and distribution of the instantaneous machining gap. In this paper, electrochemical deposition is proposed as an innovative method for revealing the instantaneous machining gap produced during WECMM. The method is shown to be feasible in principle by a simulation. Optimum values of 1.0 A/dm2 for the current density and 3 h for the machining time are determined experimentally. Several techniques for obtaining a clear contour of the machining gap are tested, and focused ion beam milling is finally selected as the best way to remove the redundant wire and metal deposited beyond the workpiece surface in the position of the machining gap. Using the proposed method, the contour of the machining gap during WECMM of pure nickel is clearly revealed for the first time.
doi_str_mv 10.20964/2020.11.20
format Article
fullrecord <record><control><sourceid>elsevier_cross</sourceid><recordid>TN_cdi_crossref_primary_10_20964_2020_11_20</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S1452398123072061</els_id><sourcerecordid>S1452398123072061</sourcerecordid><originalsourceid>FETCH-LOGICAL-c316t-cc6443aaaa44fb843347d054235ccc917f1c4fc47187a6cee0f6219d7976fbfe3</originalsourceid><addsrcrecordid>eNptUN9LwzAQDqLgmHvyH-i7dCZN2qyPss052FDEPYfsenGRrhlJN_HFv32pExHxOO7nd8d3R8g1o8OMloW4zWhGh4zF7Iz0mMizlJcjdv4rviSDEN5oFFFyIWWPfD7jAXVtm9ek3WAyb0Krm6jo9iFZatjYpuvN9C558q7aA1bJZO-72rv1mExrhNY72ODWgq6TpQXvtj9zq9DZv6AJ7lywrXXNFbkwug44-PZ9srqfvowf0sXjbD6-W6TAWdGmAIUQXEcRwqxHgkfyFc1FxnMAKJk0DIQBIdlI6gIQqSkyVlaylIVZG-R9cnPaG9mF4NGonbdb7T8Uo-rre6r7nmIs-ojOT2iMlA4WvQpgsYm3x5OhVZWz_84dATYMdh8</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Revealing the Instantaneous Machining Gap Produced During wire Electrochemical Micromachining Using Electrochemical Deposition</title><source>Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals</source><source>Alma/SFX Local Collection</source><source>Free Full-Text Journals in Chemistry</source><creator>Bi, Xiaolei ; Zeng, Yongbin</creator><creatorcontrib>Bi, Xiaolei ; Zeng, Yongbin</creatorcontrib><description>Wire electrochemical micromachining (WECMM) has increasingly been recognized as a promising method in producing micro-components. Research into the machining gap is of great importance for understanding the regularities of WECMM. However, studies published on the machining gap are usually approximate and simplified because it is difficult to observe and measure the formation and distribution of the instantaneous machining gap. In this paper, electrochemical deposition is proposed as an innovative method for revealing the instantaneous machining gap produced during WECMM. The method is shown to be feasible in principle by a simulation. Optimum values of 1.0 A/dm2 for the current density and 3 h for the machining time are determined experimentally. Several techniques for obtaining a clear contour of the machining gap are tested, and focused ion beam milling is finally selected as the best way to remove the redundant wire and metal deposited beyond the workpiece surface in the position of the machining gap. Using the proposed method, the contour of the machining gap during WECMM of pure nickel is clearly revealed for the first time.</description><identifier>ISSN: 1452-3981</identifier><identifier>EISSN: 1452-3981</identifier><identifier>DOI: 10.20964/2020.11.20</identifier><language>eng</language><publisher>Elsevier B.V</publisher><subject>Electrochemical deposition ; Focused ion beam milling (sputtering and etching) ; Machining gap ; Wire electrochemical micromachining (WECMM)</subject><ispartof>International journal of electrochemical science, 2020-11, Vol.15 (11), p.11080-11091</ispartof><rights>2020 The Authors. Published by ESG</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c316t-cc6443aaaa44fb843347d054235ccc917f1c4fc47187a6cee0f6219d7976fbfe3</citedby><cites>FETCH-LOGICAL-c316t-cc6443aaaa44fb843347d054235ccc917f1c4fc47187a6cee0f6219d7976fbfe3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27903,27904</link.rule.ids></links><search><creatorcontrib>Bi, Xiaolei</creatorcontrib><creatorcontrib>Zeng, Yongbin</creatorcontrib><title>Revealing the Instantaneous Machining Gap Produced During wire Electrochemical Micromachining Using Electrochemical Deposition</title><title>International journal of electrochemical science</title><description>Wire electrochemical micromachining (WECMM) has increasingly been recognized as a promising method in producing micro-components. Research into the machining gap is of great importance for understanding the regularities of WECMM. However, studies published on the machining gap are usually approximate and simplified because it is difficult to observe and measure the formation and distribution of the instantaneous machining gap. In this paper, electrochemical deposition is proposed as an innovative method for revealing the instantaneous machining gap produced during WECMM. The method is shown to be feasible in principle by a simulation. Optimum values of 1.0 A/dm2 for the current density and 3 h for the machining time are determined experimentally. Several techniques for obtaining a clear contour of the machining gap are tested, and focused ion beam milling is finally selected as the best way to remove the redundant wire and metal deposited beyond the workpiece surface in the position of the machining gap. Using the proposed method, the contour of the machining gap during WECMM of pure nickel is clearly revealed for the first time.</description><subject>Electrochemical deposition</subject><subject>Focused ion beam milling (sputtering and etching)</subject><subject>Machining gap</subject><subject>Wire electrochemical micromachining (WECMM)</subject><issn>1452-3981</issn><issn>1452-3981</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><recordid>eNptUN9LwzAQDqLgmHvyH-i7dCZN2qyPss052FDEPYfsenGRrhlJN_HFv32pExHxOO7nd8d3R8g1o8OMloW4zWhGh4zF7Iz0mMizlJcjdv4rviSDEN5oFFFyIWWPfD7jAXVtm9ek3WAyb0Krm6jo9iFZatjYpuvN9C558q7aA1bJZO-72rv1mExrhNY72ODWgq6TpQXvtj9zq9DZv6AJ7lywrXXNFbkwug44-PZ9srqfvowf0sXjbD6-W6TAWdGmAIUQXEcRwqxHgkfyFc1FxnMAKJk0DIQBIdlI6gIQqSkyVlaylIVZG-R9cnPaG9mF4NGonbdb7T8Uo-rre6r7nmIs-ojOT2iMlA4WvQpgsYm3x5OhVZWz_84dATYMdh8</recordid><startdate>20201101</startdate><enddate>20201101</enddate><creator>Bi, Xiaolei</creator><creator>Zeng, Yongbin</creator><general>Elsevier B.V</general><scope>6I.</scope><scope>AAFTH</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20201101</creationdate><title>Revealing the Instantaneous Machining Gap Produced During wire Electrochemical Micromachining Using Electrochemical Deposition</title><author>Bi, Xiaolei ; Zeng, Yongbin</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c316t-cc6443aaaa44fb843347d054235ccc917f1c4fc47187a6cee0f6219d7976fbfe3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Electrochemical deposition</topic><topic>Focused ion beam milling (sputtering and etching)</topic><topic>Machining gap</topic><topic>Wire electrochemical micromachining (WECMM)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Bi, Xiaolei</creatorcontrib><creatorcontrib>Zeng, Yongbin</creatorcontrib><collection>ScienceDirect Open Access Titles</collection><collection>Elsevier:ScienceDirect:Open Access</collection><collection>CrossRef</collection><jtitle>International journal of electrochemical science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Bi, Xiaolei</au><au>Zeng, Yongbin</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Revealing the Instantaneous Machining Gap Produced During wire Electrochemical Micromachining Using Electrochemical Deposition</atitle><jtitle>International journal of electrochemical science</jtitle><date>2020-11-01</date><risdate>2020</risdate><volume>15</volume><issue>11</issue><spage>11080</spage><epage>11091</epage><pages>11080-11091</pages><issn>1452-3981</issn><eissn>1452-3981</eissn><abstract>Wire electrochemical micromachining (WECMM) has increasingly been recognized as a promising method in producing micro-components. Research into the machining gap is of great importance for understanding the regularities of WECMM. However, studies published on the machining gap are usually approximate and simplified because it is difficult to observe and measure the formation and distribution of the instantaneous machining gap. In this paper, electrochemical deposition is proposed as an innovative method for revealing the instantaneous machining gap produced during WECMM. The method is shown to be feasible in principle by a simulation. Optimum values of 1.0 A/dm2 for the current density and 3 h for the machining time are determined experimentally. Several techniques for obtaining a clear contour of the machining gap are tested, and focused ion beam milling is finally selected as the best way to remove the redundant wire and metal deposited beyond the workpiece surface in the position of the machining gap. Using the proposed method, the contour of the machining gap during WECMM of pure nickel is clearly revealed for the first time.</abstract><pub>Elsevier B.V</pub><doi>10.20964/2020.11.20</doi><tpages>12</tpages><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier ISSN: 1452-3981
ispartof International journal of electrochemical science, 2020-11, Vol.15 (11), p.11080-11091
issn 1452-3981
1452-3981
language eng
recordid cdi_crossref_primary_10_20964_2020_11_20
source Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals; Alma/SFX Local Collection; Free Full-Text Journals in Chemistry
subjects Electrochemical deposition
Focused ion beam milling (sputtering and etching)
Machining gap
Wire electrochemical micromachining (WECMM)
title Revealing the Instantaneous Machining Gap Produced During wire Electrochemical Micromachining Using Electrochemical Deposition
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-28T03%3A11%3A07IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-elsevier_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Revealing%20the%20Instantaneous%20Machining%20Gap%20Produced%20During%20wire%20Electrochemical%20Micromachining%20Using%20Electrochemical%20Deposition&rft.jtitle=International%20journal%20of%20electrochemical%20science&rft.au=Bi,%20Xiaolei&rft.date=2020-11-01&rft.volume=15&rft.issue=11&rft.spage=11080&rft.epage=11091&rft.pages=11080-11091&rft.issn=1452-3981&rft.eissn=1452-3981&rft_id=info:doi/10.20964/2020.11.20&rft_dat=%3Celsevier_cross%3ES1452398123072061%3C/elsevier_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_els_id=S1452398123072061&rfr_iscdi=true