Novel self-aligned top-gate oxide TFT for AMOLED displays
— A novel highly reliable self‐aligned top‐gate oxide‐semiconductor thin‐film transistor (TFT) formed by using the aluminum (Al) reaction method has been developed. This TFT structure has advantages such as small‐sized TFTs, lower mask count, and small parasitic capacitance. The TFT with a 4‐μm chan...
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Veröffentlicht in: | Journal of the Society for Information Display 2012-01, Vol.20 (1), p.47-52 |
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creator | Morosawa, Narihiro Ohshima, Yoshihiro Morooka, Mitsuo Arai, Toshiaki Sasaoka, Tatsuya |
description | — A novel highly reliable self‐aligned top‐gate oxide‐semiconductor thin‐film transistor (TFT) formed by using the aluminum (Al) reaction method has been developed. This TFT structure has advantages such as small‐sized TFTs, lower mask count, and small parasitic capacitance. The TFT with a 4‐μm channel length exhibited a field‐effect mobility of 21.6 cm2/V‐sec, a threshold voltage of −1.2 V, and a subthreshold swing of 0.12 V/decade. Highly reliable TFTs were obtained after 300°C annealing without increasing the sheet resistivity of the source/drain region. A 9.9‐in.‐diagonal qHD AMOLED display was demonstrated with self‐aligned top‐gate oxide‐semiconductor TFTs for a low‐cost and ultra‐high‐definition OLED display. Excellent brightness uniformity could be achieved due to small parasitic capacitance. |
doi_str_mv | 10.1889/JSID20.1.47 |
format | Article |
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This TFT structure has advantages such as small‐sized TFTs, lower mask count, and small parasitic capacitance. The TFT with a 4‐μm channel length exhibited a field‐effect mobility of 21.6 cm2/V‐sec, a threshold voltage of −1.2 V, and a subthreshold swing of 0.12 V/decade. Highly reliable TFTs were obtained after 300°C annealing without increasing the sheet resistivity of the source/drain region. A 9.9‐in.‐diagonal qHD AMOLED display was demonstrated with self‐aligned top‐gate oxide‐semiconductor TFTs for a low‐cost and ultra‐high‐definition OLED display. 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Excellent brightness uniformity could be achieved due to small parasitic capacitance.</description><subject>brightness uniformity</subject><subject>OLED</subject><subject>Oxide semiconductor</subject><subject>parasitic capacitance</subject><subject>reliability</subject><subject>self-aligned</subject><subject>TFT</subject><subject>top gate</subject><issn>1071-0922</issn><issn>1938-3657</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><recordid>eNp9j01PAjEURRujiYiu_APdm2I77fS1S8KXGIQoGJZNmbZkdHTIdILw7x0c49LVO7k59yUXoVtGe0wpff-4nA6ThnsCzlCHaa4IlymcN0yBEaqT5BJdxfhGaSJTITtIz8u9L3D0RSC2yLef3uG63JGtrT0uD7nzeDVe4VBWuP-0mI2G2OVxV9hjvEYXwRbR3_zeLnodj1aDBzJbTKaD_oxkHDQQDUIBFRuhAudCqCb1Gc-s4E0aNHNgRVAq9YmXQTGnvQPBMuAukXoDG95Fd-3frCpjrHwwuyr_sNXRMGpOq0272jAjoLFZa3_lhT_-p_4w0-zUIW0nj7U__HVs9W4kcEjNej4x6Xy9fJFcmWf-DeehZl0</recordid><startdate>201201</startdate><enddate>201201</enddate><creator>Morosawa, Narihiro</creator><creator>Ohshima, Yoshihiro</creator><creator>Morooka, Mitsuo</creator><creator>Arai, Toshiaki</creator><creator>Sasaoka, Tatsuya</creator><general>Blackwell Publishing Ltd</general><scope>BSCLL</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>201201</creationdate><title>Novel self-aligned top-gate oxide TFT for AMOLED displays</title><author>Morosawa, Narihiro ; Ohshima, Yoshihiro ; Morooka, Mitsuo ; Arai, Toshiaki ; Sasaoka, Tatsuya</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3797-9748704b48f33448c37ec3ca43704f91d7a4f885e2e6f81d9ed741c73d269b7b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>brightness uniformity</topic><topic>OLED</topic><topic>Oxide semiconductor</topic><topic>parasitic capacitance</topic><topic>reliability</topic><topic>self-aligned</topic><topic>TFT</topic><topic>top gate</topic><toplevel>online_resources</toplevel><creatorcontrib>Morosawa, Narihiro</creatorcontrib><creatorcontrib>Ohshima, Yoshihiro</creatorcontrib><creatorcontrib>Morooka, Mitsuo</creatorcontrib><creatorcontrib>Arai, Toshiaki</creatorcontrib><creatorcontrib>Sasaoka, Tatsuya</creatorcontrib><collection>Istex</collection><collection>CrossRef</collection><jtitle>Journal of the Society for Information Display</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Morosawa, Narihiro</au><au>Ohshima, Yoshihiro</au><au>Morooka, Mitsuo</au><au>Arai, Toshiaki</au><au>Sasaoka, Tatsuya</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Novel self-aligned top-gate oxide TFT for AMOLED displays</atitle><jtitle>Journal of the Society for Information Display</jtitle><date>2012-01</date><risdate>2012</risdate><volume>20</volume><issue>1</issue><spage>47</spage><epage>52</epage><pages>47-52</pages><issn>1071-0922</issn><eissn>1938-3657</eissn><abstract>— A novel highly reliable self‐aligned top‐gate oxide‐semiconductor thin‐film transistor (TFT) formed by using the aluminum (Al) reaction method has been developed. This TFT structure has advantages such as small‐sized TFTs, lower mask count, and small parasitic capacitance. The TFT with a 4‐μm channel length exhibited a field‐effect mobility of 21.6 cm2/V‐sec, a threshold voltage of −1.2 V, and a subthreshold swing of 0.12 V/decade. Highly reliable TFTs were obtained after 300°C annealing without increasing the sheet resistivity of the source/drain region. A 9.9‐in.‐diagonal qHD AMOLED display was demonstrated with self‐aligned top‐gate oxide‐semiconductor TFTs for a low‐cost and ultra‐high‐definition OLED display. Excellent brightness uniformity could be achieved due to small parasitic capacitance.</abstract><cop>Oxford, UK</cop><pub>Blackwell Publishing Ltd</pub><doi>10.1889/JSID20.1.47</doi><tpages>6</tpages></addata></record> |
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subjects | brightness uniformity OLED Oxide semiconductor parasitic capacitance reliability self-aligned TFT top gate |
title | Novel self-aligned top-gate oxide TFT for AMOLED displays |
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