P-90: Permeation Properties of Inorganic Thin-Film and Its Application to PM-OLED using Electron Beam Evaporation System
In this paper, the inorganic thin‐film passivation layer was proposed to protect the passive matrix organic light diodes (PMOLEDs) with the cathode separator from moisture and oxygen. Passivation film is deposited by electron beam evaporation. There is important thing not to damage on organic layer...
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Veröffentlicht in: | SID International Symposium Digest of technical papers 2003-05, Vol.34 (1), p.563-565 |
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creator | Kim, Kwang Ho Kim, Hoon Koo, Hong Mo Kim, Jai Kyeong Kim, Young Chul Ju, Byeong Kwon Han, Jung In Moon, Dae Gyu Jang, Jin |
description | In this paper, the inorganic thin‐film passivation layer was proposed to protect the passive matrix organic light diodes (PMOLEDs) with the cathode separator from moisture and oxygen. Passivation film is deposited by electron beam evaporation. There is important thing not to damage on organic layer and to select suitable passivation materials. So, the various kinds of inorganic matrials were deposited onto the poly(carbonate) film and water vapor transmission rates (WVTRs) of these films were measured. As a result of WVTRs, the MgO thin‐film had lower WVTR value than any other inorganic thin‐films. In this investigation, we analyzed the properties of the current‐voltage and luminescence characteristics for both MgO‐passivated OLED and nonpassivated OLED. MgO‐passivated OLED were remarkable improved the lifetime compare to non‐passivated OLED. Therefore, we can consider that the MgO thin‐film passivation mathod is one of the most suitable candidates for the thin‐film passivation layer for OLED. |
doi_str_mv | 10.1889/1.1832338 |
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fullrecord | <record><control><sourceid>istex_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1889_1_1832338</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>ark_67375_WNG_8P9L9Q86_S</sourcerecordid><originalsourceid>FETCH-LOGICAL-c1523-8f57e5610a487edd584fb3f0f870cfb2306d8b378f7cb770c4588abf551c2bc33</originalsourceid><addsrcrecordid>eNp1kMtOwzAURC0EEuWx4A-8ZWFqx3HssIM2hUoFgloEO8txbDDkJTs8-vcEBbFjNdLcMyPdAeCE4DMiRDolg9CIUrEDJhFJBMKEpbtggnHKUZokT_vgIIRXjCmN43QCvnKU4nOYG18b1bu2gblvO-N7ZwJsLVw2rX9WjdNw8-IatHBVDVVTwmUf4EXXVU6Pqb6F-Q26W2Vz-B5c8wyzyujeD5dLo2qYfaiu9SO63obe1Edgz6oqmONfPQQPi2wzu0aru6vl7GKFNGERRcIyblhCsIoFN2XJRGwLarEVHGtbRBQnpSgoF5brgg9ezIRQhWWM6KjQlB6C07FX-zYEb6zsvKuV30qC5c9kksjfyQZ2OrKfrjLb_0G5nm_ymJCfdjQm3PDT119C-TeZcMqZfLy9kiJPV-m9SOSafgPIn3st</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>P-90: Permeation Properties of Inorganic Thin-Film and Its Application to PM-OLED using Electron Beam Evaporation System</title><source>Wiley Online Library Journals Frontfile Complete</source><creator>Kim, Kwang Ho ; Kim, Hoon ; Koo, Hong Mo ; Kim, Jai Kyeong ; Kim, Young Chul ; Ju, Byeong Kwon ; Han, Jung In ; Moon, Dae Gyu ; Jang, Jin</creator><creatorcontrib>Kim, Kwang Ho ; Kim, Hoon ; Koo, Hong Mo ; Kim, Jai Kyeong ; Kim, Young Chul ; Ju, Byeong Kwon ; Han, Jung In ; Moon, Dae Gyu ; Jang, Jin</creatorcontrib><description>In this paper, the inorganic thin‐film passivation layer was proposed to protect the passive matrix organic light diodes (PMOLEDs) with the cathode separator from moisture and oxygen. Passivation film is deposited by electron beam evaporation. There is important thing not to damage on organic layer and to select suitable passivation materials. So, the various kinds of inorganic matrials were deposited onto the poly(carbonate) film and water vapor transmission rates (WVTRs) of these films were measured. As a result of WVTRs, the MgO thin‐film had lower WVTR value than any other inorganic thin‐films. In this investigation, we analyzed the properties of the current‐voltage and luminescence characteristics for both MgO‐passivated OLED and nonpassivated OLED. MgO‐passivated OLED were remarkable improved the lifetime compare to non‐passivated OLED. Therefore, we can consider that the MgO thin‐film passivation mathod is one of the most suitable candidates for the thin‐film passivation layer for OLED.</description><identifier>ISSN: 0097-966X</identifier><identifier>EISSN: 2168-0159</identifier><identifier>DOI: 10.1889/1.1832338</identifier><language>eng</language><publisher>Oxford, UK: Blackwell Publishing Ltd</publisher><ispartof>SID International Symposium Digest of technical papers, 2003-05, Vol.34 (1), p.563-565</ispartof><rights>2003 Society for Information Display</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c1523-8f57e5610a487edd584fb3f0f870cfb2306d8b378f7cb770c4588abf551c2bc33</citedby><cites>FETCH-LOGICAL-c1523-8f57e5610a487edd584fb3f0f870cfb2306d8b378f7cb770c4588abf551c2bc33</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1889%2F1.1832338$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1889%2F1.1832338$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,776,780,1411,27901,27902,45550,45551</link.rule.ids></links><search><creatorcontrib>Kim, Kwang Ho</creatorcontrib><creatorcontrib>Kim, Hoon</creatorcontrib><creatorcontrib>Koo, Hong Mo</creatorcontrib><creatorcontrib>Kim, Jai Kyeong</creatorcontrib><creatorcontrib>Kim, Young Chul</creatorcontrib><creatorcontrib>Ju, Byeong Kwon</creatorcontrib><creatorcontrib>Han, Jung In</creatorcontrib><creatorcontrib>Moon, Dae Gyu</creatorcontrib><creatorcontrib>Jang, Jin</creatorcontrib><title>P-90: Permeation Properties of Inorganic Thin-Film and Its Application to PM-OLED using Electron Beam Evaporation System</title><title>SID International Symposium Digest of technical papers</title><description>In this paper, the inorganic thin‐film passivation layer was proposed to protect the passive matrix organic light diodes (PMOLEDs) with the cathode separator from moisture and oxygen. Passivation film is deposited by electron beam evaporation. There is important thing not to damage on organic layer and to select suitable passivation materials. So, the various kinds of inorganic matrials were deposited onto the poly(carbonate) film and water vapor transmission rates (WVTRs) of these films were measured. As a result of WVTRs, the MgO thin‐film had lower WVTR value than any other inorganic thin‐films. In this investigation, we analyzed the properties of the current‐voltage and luminescence characteristics for both MgO‐passivated OLED and nonpassivated OLED. MgO‐passivated OLED were remarkable improved the lifetime compare to non‐passivated OLED. Therefore, we can consider that the MgO thin‐film passivation mathod is one of the most suitable candidates for the thin‐film passivation layer for OLED.</description><issn>0097-966X</issn><issn>2168-0159</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2003</creationdate><recordtype>article</recordtype><recordid>eNp1kMtOwzAURC0EEuWx4A-8ZWFqx3HssIM2hUoFgloEO8txbDDkJTs8-vcEBbFjNdLcMyPdAeCE4DMiRDolg9CIUrEDJhFJBMKEpbtggnHKUZokT_vgIIRXjCmN43QCvnKU4nOYG18b1bu2gblvO-N7ZwJsLVw2rX9WjdNw8-IatHBVDVVTwmUf4EXXVU6Pqb6F-Q26W2Vz-B5c8wyzyujeD5dLo2qYfaiu9SO63obe1Edgz6oqmONfPQQPi2wzu0aru6vl7GKFNGERRcIyblhCsIoFN2XJRGwLarEVHGtbRBQnpSgoF5brgg9ezIRQhWWM6KjQlB6C07FX-zYEb6zsvKuV30qC5c9kksjfyQZ2OrKfrjLb_0G5nm_ymJCfdjQm3PDT119C-TeZcMqZfLy9kiJPV-m9SOSafgPIn3st</recordid><startdate>200305</startdate><enddate>200305</enddate><creator>Kim, Kwang Ho</creator><creator>Kim, Hoon</creator><creator>Koo, Hong Mo</creator><creator>Kim, Jai Kyeong</creator><creator>Kim, Young Chul</creator><creator>Ju, Byeong Kwon</creator><creator>Han, Jung In</creator><creator>Moon, Dae Gyu</creator><creator>Jang, Jin</creator><general>Blackwell Publishing Ltd</general><scope>BSCLL</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>200305</creationdate><title>P-90: Permeation Properties of Inorganic Thin-Film and Its Application to PM-OLED using Electron Beam Evaporation System</title><author>Kim, Kwang Ho ; Kim, Hoon ; Koo, Hong Mo ; Kim, Jai Kyeong ; Kim, Young Chul ; Ju, Byeong Kwon ; Han, Jung In ; Moon, Dae Gyu ; Jang, Jin</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1523-8f57e5610a487edd584fb3f0f870cfb2306d8b378f7cb770c4588abf551c2bc33</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2003</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kim, Kwang Ho</creatorcontrib><creatorcontrib>Kim, Hoon</creatorcontrib><creatorcontrib>Koo, Hong Mo</creatorcontrib><creatorcontrib>Kim, Jai Kyeong</creatorcontrib><creatorcontrib>Kim, Young Chul</creatorcontrib><creatorcontrib>Ju, Byeong Kwon</creatorcontrib><creatorcontrib>Han, Jung In</creatorcontrib><creatorcontrib>Moon, Dae Gyu</creatorcontrib><creatorcontrib>Jang, Jin</creatorcontrib><collection>Istex</collection><collection>CrossRef</collection><jtitle>SID International Symposium Digest of technical papers</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kim, Kwang Ho</au><au>Kim, Hoon</au><au>Koo, Hong Mo</au><au>Kim, Jai Kyeong</au><au>Kim, Young Chul</au><au>Ju, Byeong Kwon</au><au>Han, Jung In</au><au>Moon, Dae Gyu</au><au>Jang, Jin</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>P-90: Permeation Properties of Inorganic Thin-Film and Its Application to PM-OLED using Electron Beam Evaporation System</atitle><jtitle>SID International Symposium Digest of technical papers</jtitle><date>2003-05</date><risdate>2003</risdate><volume>34</volume><issue>1</issue><spage>563</spage><epage>565</epage><pages>563-565</pages><issn>0097-966X</issn><eissn>2168-0159</eissn><abstract>In this paper, the inorganic thin‐film passivation layer was proposed to protect the passive matrix organic light diodes (PMOLEDs) with the cathode separator from moisture and oxygen. Passivation film is deposited by electron beam evaporation. There is important thing not to damage on organic layer and to select suitable passivation materials. So, the various kinds of inorganic matrials were deposited onto the poly(carbonate) film and water vapor transmission rates (WVTRs) of these films were measured. As a result of WVTRs, the MgO thin‐film had lower WVTR value than any other inorganic thin‐films. In this investigation, we analyzed the properties of the current‐voltage and luminescence characteristics for both MgO‐passivated OLED and nonpassivated OLED. MgO‐passivated OLED were remarkable improved the lifetime compare to non‐passivated OLED. Therefore, we can consider that the MgO thin‐film passivation mathod is one of the most suitable candidates for the thin‐film passivation layer for OLED.</abstract><cop>Oxford, UK</cop><pub>Blackwell Publishing Ltd</pub><doi>10.1889/1.1832338</doi><tpages>3</tpages></addata></record> |
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title | P-90: Permeation Properties of Inorganic Thin-Film and Its Application to PM-OLED using Electron Beam Evaporation System |
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