Electrochemical Characterization of Cathodized Copper Oxide Thin Films
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| Veröffentlicht in: | Journal of nuclear physics, material sciences, radiation and applications material sciences, radiation and applications, 2015-02, Vol.2 (2), p.159-167 |
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| Format: | Artikel |
| Sprache: | eng |
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| container_end_page | 167 |
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| container_issue | 2 |
| container_start_page | 159 |
| container_title | Journal of nuclear physics, material sciences, radiation and applications |
| container_volume | 2 |
| creator | Ghadge, T.S. Lokhande, B.J. |
| description | |
| doi_str_mv | 10.15415/jnp.2015.22012 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 2321-8649 |
| ispartof | Journal of nuclear physics, material sciences, radiation and applications, 2015-02, Vol.2 (2), p.159-167 |
| issn | 2321-8649 2321-9289 |
| language | eng |
| recordid | cdi_crossref_primary_10_15415_jnp_2015_22012 |
| source | EZB-FREE-00999 freely available EZB journals |
| title | Electrochemical Characterization of Cathodized Copper Oxide Thin Films |
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