Oxide-ion conduction and dielectric relaxation in the fluorite-type Zr0.8Ln0.2O1.9 (Ln = Nd, Sm, Eu, Gd, Dy, Ho, Er, Tm, Yb, Lu) system

The electrical conductivity and dielectric properties of the Zr0.8Ln0.2O1.9 (Ln = Nd, Sm, Eu, Gd, Dy, Ho, Er, Tm, Yb, Lu) system which have a cubic fluorite-type structure were investigated in order to clarify a dynamic property of oxygen vacancy in oxide-ion conductors. The frequency dependences of...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Transactions of the Materials Research Society of Japan 2010/09/01, Vol.35(3), pp.655-658
Hauptverfasser:	Kawamoto, Jun-ichi, Yagi, Yuhji, Satake, Jun, Takayama, Toshio, Yamamura, Hiroshi
Format:	Artikel
Sprache:	eng
Schlagworte:	Dielectric relaxation Fluorite-type compound Oxide-ion conduction Oxygen defect
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!