Scanning Photoelectron Microscopy: a Powerful Technique for Probing Micro and Nano-Structures

Scanning photoelectron microscopy (SPEM) is a powerful technique to image and probe micro and nano-structures. Recent achievements on imaging the sub-micro objects will be present in this report. For the first time, SPEM is used to explore and probe the chemical state and chemical composition of ind...

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Veröffentlicht in:	E-journal of surface science and nanotechnology 2011/04/09, Vol.9, pp.158-162
Hauptverfasser:	Abyaneh, Majid Kazemian, Gregoratti, Luca, Amati, Matteo, Dalmiglio, Matteo, Kiskinova, Maya
Format:	Artikel
Sprache:	eng
Schlagworte:	Multi-wall carbon nanotube Scanning photoelectron microscopy (SPEM) Spectromicroscopy XPS
Online-Zugang:	Volltext
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