Sub-pixel dimensional measurement algorithm based on intensity integration threshold

Sub-pixel dimensional measurement algorithm based on intensity integration threshold

In this paper, we proposed a sub-pixel measurement algorithm based on intensity integration threshold (IIT). The proposed method can localize the sub-pixel edges in an inexpensive way by calculating the integration of the intensity across the edge and finding the point where the integration reaches...

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Veröffentlicht in:OSA continuum 2020-10, Vol.3 (10), p.2912
Hauptverfasser: Chu, Menglin, Huang, Wei, Xu, Mingfei, Jia, Shuqiang, Zhang, Xiaofei, Lu, Yongnan
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container_issue 10
container_start_page 2912
container_title OSA continuum
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creator Chu, Menglin
Huang, Wei
Xu, Mingfei
Jia, Shuqiang
Zhang, Xiaofei
Lu, Yongnan
description In this paper, we proposed a sub-pixel measurement algorithm based on intensity integration threshold (IIT). The proposed method can localize the sub-pixel edges in an inexpensive way by calculating the integration of the intensity across the edge and finding the point where the integration reaches the threshold. Comparative tests show our method realized better efficiency and robustness in practical applications than other state-of-the-art algorithms.
doi_str_mv 10.1364/OSAC.402101
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title Sub-pixel dimensional measurement algorithm based on intensity integration threshold
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