Elastic Analysis of a Triangular Pyramidal Indentation of a Two-Layer Thin Film
In order to evaluate the mechanical properties of a very thin film, a method combining the analysis with the experiment of triangular pyramidal indentation (the nanoindentation method) is proposed. The particular formulation of FEM of triangular pyramidal indentation is established. The indentation...
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Veröffentlicht in: | TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series A 1994/12/25, Vol.60(580), pp.2731-2736 |
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container_title | TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series A |
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creator | Yanai, Hidetoshi Itokazu, Masaya Murakami, Yukitaka Kishine, Nobuyuki |
description | In order to evaluate the mechanical properties of a very thin film, a method combining the analysis with the experiment of triangular pyramidal indentation (the nanoindentation method) is proposed. The particular formulation of FEM of triangular pyramidal indentation is established. The indentation load-displacement relationship is obtained for a thin film sputtered or sprayed on a substrate with different mechanical properties. The effects of film thickness and mechanical properties of the film and the substrate are clarified quantitatively. Coupling the analytical results with experimental measurements enables one to determine the mechanical properties of very thin films. |
doi_str_mv | 10.1299/kikaia.60.2731 |
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The particular formulation of FEM of triangular pyramidal indentation is established. The indentation load-displacement relationship is obtained for a thin film sputtered or sprayed on a substrate with different mechanical properties. The effects of film thickness and mechanical properties of the film and the substrate are clarified quantitatively. 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The particular formulation of FEM of triangular pyramidal indentation is established. The indentation load-displacement relationship is obtained for a thin film sputtered or sprayed on a substrate with different mechanical properties. The effects of film thickness and mechanical properties of the film and the substrate are clarified quantitatively. Coupling the analytical results with experimental measurements enables one to determine the mechanical properties of very thin films.</abstract><pub>The Japan Society of Mechanical Engineers</pub><doi>10.1299/kikaia.60.2731</doi><tpages>6</tpages><oa>free_for_read</oa></addata></record> |
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source | J-STAGE Free; EZB-FREE-00999 freely available EZB journals |
subjects | Finite-Element Method Nanoindentation Method Thin Film Triangular Pyramidal Indentation Young's Modulus |
title | Elastic Analysis of a Triangular Pyramidal Indentation of a Two-Layer Thin Film |
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