Raman Study of Multicrystalline Silicon Wafers Produced by the RST Process
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| Veröffentlicht in: | Acta physica Polonica, A A, 2014-04, Vol.125 (4), p.1006-1009 |
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| Sprache: | eng |
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| container_end_page | 1009 |
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| container_issue | 4 |
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| container_title | Acta physica Polonica, A |
| container_volume | 125 |
| creator | Tejero, A. Tupin, E. González, M.A. Martínez, O. Jiménez, J. Belouet, C. Baillis, C. |
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| doi_str_mv | 10.12693/APhysPolA.125.1006 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 0587-4246 |
| ispartof | Acta physica Polonica, A, 2014-04, Vol.125 (4), p.1006-1009 |
| issn | 0587-4246 1898-794X |
| language | eng |
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| source | DOAJ Directory of Open Access Journals; Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals; Alma/SFX Local Collection |
| title | Raman Study of Multicrystalline Silicon Wafers Produced by the RST Process |
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