Electron backscattered diffraction analyses combined with environmental scanning electron microscopy: potential applications for non-conducting, uncoated mineralogical samples
Operational techniques have been developed which combine electron backscattered diffraction (EBSD) analysis with orientation contrast and secondary electron imaging in environmental scanning electron microscopy (ESEM). This is specifically directed towards the analysis of uncoated, non-conducting ma...
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Veröffentlicht in: | Materials science and technology 2000-11, Vol.16 (11-12), p.1393-1398 |
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