Principle and application of the constant strain rate tensile test with in situ scanning electron microscopy for evaluation of the adhesion of films
Based on the theory of mechanics of materials, a constant strain rate tensile test with in situ scanning electron microscopy (SEM) for measuring the adhesion of PVD films was developed, and the adhesion of a film to a substrate was determined in terms of the shear strain energy of the film during th...
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Veröffentlicht in: | Journal of adhesion science and technology 1997-01, Vol.11 (1), p.127-136 |
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Format: | Artikel |
Sprache: | eng |
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