Principle and application of the constant strain rate tensile test with in situ scanning electron microscopy for evaluation of the adhesion of films
Based on the theory of mechanics of materials, a constant strain rate tensile test with in situ scanning electron microscopy (SEM) for measuring the adhesion of PVD films was developed, and the adhesion of a film to a substrate was determined in terms of the shear strain energy of the film during th...
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Veröffentlicht in: | Journal of adhesion science and technology 1997-01, Vol.11 (1), p.127-136 |
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container_title | Journal of adhesion science and technology |
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creator | Yu, L. Liu, J.W. Dai, S.X. Jin, Z.J. |
description | Based on the theory of mechanics of materials, a constant strain rate tensile test with in situ scanning electron microscopy (SEM) for measuring the adhesion of PVD films was developed, and the adhesion of a film to a substrate was determined in terms of the shear strain energy of the
film during the elongation of the film/substrate combination, i.e. the adhesion depends on the elongation ΔL of the film/substrate combination. The adhesion of three different TiN films prepared by different processes was evaluated by the constant strain rate tensile test with in situ
SEM and the conventional scratch test. The results of the two tests show that (1) when the films are thin the adhesion values are in good agreement, but for the thick films with increasing thickness the adhesion decreases in the tensile test while the adhesion first increases and then decreases
in the scratch test and (2) for three different TiN films of the same thickness, the identical adhesion order was obtained in the two tests. |
doi_str_mv | 10.1163/156856197X01065 |
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fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1163_156856197X01065</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>27302287</sourcerecordid><originalsourceid>FETCH-LOGICAL-c304t-146fe95fd48bc0fab04d860c3b2b0cc39ff2f268719a4718663949285308b2933</originalsourceid><addsrcrecordid>eNp1kE9r3DAQxUVJodttz73qEHJzV39s2c4tLE0TCCSHBHIzY1nqqsiSI2m77PfoB66c3QRSyGnQ6L03Mz-EvlHynVLBV7QSTSVoWz8SSkT1AS3mTpFb4gQtCBVtUbKSf0KfY_xNCOWC0AX6exeMk2ayCoMbMEyTNRKS8Q57jdNGYeldTOASjimAcThAUjgpF42da0x4Z9IG559o0hZHCc4Z9wsrq2QKOWc0Mvgo_bTH2ges_oDdvpkAw0bF41sbO8Yv6KMGG9XXY12ih8sf9-ur4ub25_X64qaQnJSpoKXQqq30UDa9JBp6Ug6NIJL3rCdS8lZrpploatpCWdNGCN6WLWsqTpqetZwv0dkhdwr-aZtP6UYTpbIWnPLb2LGaE8aaOgtXB-F8SQxKd1MwI4R9R0k30-_-o58dp8doyESsDpApx1cbqyoinjc4P8iMy2xG2Plghy7B3vrw4uHvzfgHnG-Zag</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>27302287</pqid></control><display><type>article</type><title>Principle and application of the constant strain rate tensile test with in situ scanning electron microscopy for evaluation of the adhesion of films</title><source>Access via Taylor & Francis</source><creator>Yu, L. ; Liu, J.W. ; Dai, S.X. ; Jin, Z.J.</creator><creatorcontrib>Yu, L. ; Liu, J.W. ; Dai, S.X. ; Jin, Z.J.</creatorcontrib><description>Based on the theory of mechanics of materials, a constant strain rate tensile test with in situ scanning electron microscopy (SEM) for measuring the adhesion of PVD films was developed, and the adhesion of a film to a substrate was determined in terms of the shear strain energy of the
film during the elongation of the film/substrate combination, i.e. the adhesion depends on the elongation ΔL of the film/substrate combination. The adhesion of three different TiN films prepared by different processes was evaluated by the constant strain rate tensile test with in situ
SEM and the conventional scratch test. The results of the two tests show that (1) when the films are thin the adhesion values are in good agreement, but for the thick films with increasing thickness the adhesion decreases in the tensile test while the adhesion first increases and then decreases
in the scratch test and (2) for three different TiN films of the same thickness, the identical adhesion order was obtained in the two tests.</description><identifier>ISSN: 0169-4243</identifier><identifier>EISSN: 1568-5616</identifier><identifier>DOI: 10.1163/156856197X01065</identifier><identifier>CODEN: JATEE8</identifier><language>eng</language><publisher>Leiden: Taylor & Francis Group</publisher><subject>Adhesion ; Applied sciences ; constant strain rate tensile test with in situ SEM ; Exact sciences and technology ; Metals. Metallurgy ; Nonmetallic coatings ; Production techniques ; scratch test ; Surface treatment ; TiN films</subject><ispartof>Journal of adhesion science and technology, 1997-01, Vol.11 (1), p.127-136</ispartof><rights>Copyright Taylor & Francis Group, LLC 1997</rights><rights>1997 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c304t-146fe95fd48bc0fab04d860c3b2b0cc39ff2f268719a4718663949285308b2933</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://www.tandfonline.com/doi/pdf/10.1163/156856197X01065$$EPDF$$P50$$Ginformaworld$$H</linktopdf><linktohtml>$$Uhttps://www.tandfonline.com/doi/full/10.1163/156856197X01065$$EHTML$$P50$$Ginformaworld$$H</linktohtml><link.rule.ids>314,780,784,4024,27923,27924,27925,59647,60436</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=2550693$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Yu, L.</creatorcontrib><creatorcontrib>Liu, J.W.</creatorcontrib><creatorcontrib>Dai, S.X.</creatorcontrib><creatorcontrib>Jin, Z.J.</creatorcontrib><title>Principle and application of the constant strain rate tensile test with in situ scanning electron microscopy for evaluation of the adhesion of films</title><title>Journal of adhesion science and technology</title><description>Based on the theory of mechanics of materials, a constant strain rate tensile test with in situ scanning electron microscopy (SEM) for measuring the adhesion of PVD films was developed, and the adhesion of a film to a substrate was determined in terms of the shear strain energy of the
film during the elongation of the film/substrate combination, i.e. the adhesion depends on the elongation ΔL of the film/substrate combination. The adhesion of three different TiN films prepared by different processes was evaluated by the constant strain rate tensile test with in situ
SEM and the conventional scratch test. The results of the two tests show that (1) when the films are thin the adhesion values are in good agreement, but for the thick films with increasing thickness the adhesion decreases in the tensile test while the adhesion first increases and then decreases
in the scratch test and (2) for three different TiN films of the same thickness, the identical adhesion order was obtained in the two tests.</description><subject>Adhesion</subject><subject>Applied sciences</subject><subject>constant strain rate tensile test with in situ SEM</subject><subject>Exact sciences and technology</subject><subject>Metals. Metallurgy</subject><subject>Nonmetallic coatings</subject><subject>Production techniques</subject><subject>scratch test</subject><subject>Surface treatment</subject><subject>TiN films</subject><issn>0169-4243</issn><issn>1568-5616</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1997</creationdate><recordtype>article</recordtype><recordid>eNp1kE9r3DAQxUVJodttz73qEHJzV39s2c4tLE0TCCSHBHIzY1nqqsiSI2m77PfoB66c3QRSyGnQ6L03Mz-EvlHynVLBV7QSTSVoWz8SSkT1AS3mTpFb4gQtCBVtUbKSf0KfY_xNCOWC0AX6exeMk2ayCoMbMEyTNRKS8Q57jdNGYeldTOASjimAcThAUjgpF42da0x4Z9IG559o0hZHCc4Z9wsrq2QKOWc0Mvgo_bTH2ges_oDdvpkAw0bF41sbO8Yv6KMGG9XXY12ih8sf9-ur4ub25_X64qaQnJSpoKXQqq30UDa9JBp6Ug6NIJL3rCdS8lZrpploatpCWdNGCN6WLWsqTpqetZwv0dkhdwr-aZtP6UYTpbIWnPLb2LGaE8aaOgtXB-F8SQxKd1MwI4R9R0k30-_-o58dp8doyESsDpApx1cbqyoinjc4P8iMy2xG2Plghy7B3vrw4uHvzfgHnG-Zag</recordid><startdate>19970101</startdate><enddate>19970101</enddate><creator>Yu, L.</creator><creator>Liu, J.W.</creator><creator>Dai, S.X.</creator><creator>Jin, Z.J.</creator><general>Taylor & Francis Group</general><general>Brill</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>19970101</creationdate><title>Principle and application of the constant strain rate tensile test with in situ scanning electron microscopy for evaluation of the adhesion of films</title><author>Yu, L. ; Liu, J.W. ; Dai, S.X. ; Jin, Z.J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c304t-146fe95fd48bc0fab04d860c3b2b0cc39ff2f268719a4718663949285308b2933</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1997</creationdate><topic>Adhesion</topic><topic>Applied sciences</topic><topic>constant strain rate tensile test with in situ SEM</topic><topic>Exact sciences and technology</topic><topic>Metals. Metallurgy</topic><topic>Nonmetallic coatings</topic><topic>Production techniques</topic><topic>scratch test</topic><topic>Surface treatment</topic><topic>TiN films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yu, L.</creatorcontrib><creatorcontrib>Liu, J.W.</creatorcontrib><creatorcontrib>Dai, S.X.</creatorcontrib><creatorcontrib>Jin, Z.J.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Journal of adhesion science and technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Yu, L.</au><au>Liu, J.W.</au><au>Dai, S.X.</au><au>Jin, Z.J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Principle and application of the constant strain rate tensile test with in situ scanning electron microscopy for evaluation of the adhesion of films</atitle><jtitle>Journal of adhesion science and technology</jtitle><date>1997-01-01</date><risdate>1997</risdate><volume>11</volume><issue>1</issue><spage>127</spage><epage>136</epage><pages>127-136</pages><issn>0169-4243</issn><eissn>1568-5616</eissn><coden>JATEE8</coden><abstract>Based on the theory of mechanics of materials, a constant strain rate tensile test with in situ scanning electron microscopy (SEM) for measuring the adhesion of PVD films was developed, and the adhesion of a film to a substrate was determined in terms of the shear strain energy of the
film during the elongation of the film/substrate combination, i.e. the adhesion depends on the elongation ΔL of the film/substrate combination. The adhesion of three different TiN films prepared by different processes was evaluated by the constant strain rate tensile test with in situ
SEM and the conventional scratch test. The results of the two tests show that (1) when the films are thin the adhesion values are in good agreement, but for the thick films with increasing thickness the adhesion decreases in the tensile test while the adhesion first increases and then decreases
in the scratch test and (2) for three different TiN films of the same thickness, the identical adhesion order was obtained in the two tests.</abstract><cop>Leiden</cop><pub>Taylor & Francis Group</pub><doi>10.1163/156856197X01065</doi><tpages>10</tpages></addata></record> |
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subjects | Adhesion Applied sciences constant strain rate tensile test with in situ SEM Exact sciences and technology Metals. Metallurgy Nonmetallic coatings Production techniques scratch test Surface treatment TiN films |
title | Principle and application of the constant strain rate tensile test with in situ scanning electron microscopy for evaluation of the adhesion of films |
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