Re-Anodizing Technique as a Method of Investigation of Thermally Activated Defects in Anodic Alumina Films
A new approach of determination of energy of shallow thermally activated traps in the anodic alumina films is suggested. The approach consists of the heat-treatment of the anodic Al2O3|Al structure at 100-350°C (this means thermal release of electrons from the traps) and then re-anodizing of the ano...
Gespeichert in:
| Veröffentlicht in: | Journal of the Electrochemical Society 2013-01, Vol.160 (6), p.C285-C290 |
|---|---|
| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Schreiben Sie den ersten Kommentar!