Measuring Impact of Light on the Resistance of Non-Doped ZnO Films

This paper demonstrates the significant impact of light on non-doped ZnO films during resistance measurement. A very long time constant of the order of 103 sec is observed. Based on the wave-length dependence of the charging and discharging time constant, possible physical mechanisms are discussed....

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Veröffentlicht in:	ECS journal of solid state science and technology 2019-01, Vol.8 (1), p.P57-P61
Hauptverfasser:	Takahashi, Naoto, Sato, Shingo, Omura, Yasuhisa, Saitoh, Tadashi
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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