Extraction and Analysis of Gamma Irradiated Si BJT SPICE Model

The Simulation Program with Integrated Circuit Emphasis (SPICE) model parameters of pre and post-irradiated silicon bipolar junction transistor (Si BJT) were extracted with the use of Altium Designer (AD)/SPICE model wizard. The percentage changes (Δ%) between forward and reverse-bias parameters of...

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Veröffentlicht in:	ECS journal of solid state science and technology 2019-01, Vol.8 (1), p.P51-P56
Hauptverfasser:	Lawal, Olarewaju Mubashiru, Liu, Shuhuan, Huang, Taiyi
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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