In-Operando X-ray Tomography Study of Lithiation Induced Delamination of Si Based Anodes for Lithium-Ion Batteries

Silicon-Lithium based rechargeable batteries offer high gravimetric capacity. However cycle life and electrode microstructure failure mechanisms remain poorly understood. Here we present an X-ray tomography method to investigate in-operando lithiation induced stress cracking leading to the delaminat...

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Veröffentlicht in:	ECS electrochemistry letters 2014-05, Vol.3 (7), p.A76-A78
Hauptverfasser:	Tariq, Farid, Yufit, Vladimir, Eastwood, David S., Merla, Yu, Biton, Moshiel, Wu, Billy, Chen, Zhangwei, Freedman, Kathrin, Offer, Gregory, Peled, Emanuel, Lee, Peter D., Golodnitsky, Diana, Brandon, Nigel
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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