A Simulation Comparison between Junctionless and Inversion-Mode MuGFETs
A new type of multigate MOSFET, called the junctionless nanowire transistor (JNT), has recently been proposed. It avoids junction formation problem and can be used to make very short-channel devices. Here, we compare the properties and performances of junctionless nanowire transistors with those of...
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creator | Colinge, Jean-Pierre Kranti, Abhinav Yan, Ran Ferain, Isabelle Dehdashti Akhavan, Nima Razavi, Pedram Lee, Chi-Woo Yu, Ran Colinge, Cindy |
description | A new type of multigate MOSFET, called the junctionless nanowire transistor (JNT), has recently been proposed. It avoids junction formation problem and can be used to make very short-channel devices. Here, we compare the properties and performances of junctionless nanowire transistors with those of with Π-gate inversion-mode (IM) devices. The performances of silicon JNTs and IM transistors are evaluated in terms of short-channel effects, current drive, and gate capacitance. Junctionless devices are shown to have smaller short-channel effects than inversion-mode transistors with junctions. Comparison of carrier transport in the channel is made between junctionless nanowires and inversion-mode multigate field-effect transistors, and the benefits/drawbacks of bulk transport vs. surface transport are addressed. |
doi_str_mv | 10.1149/1.3570778 |
format | Conference Proceeding |
fullrecord | <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1149_1_3570778</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1149_1_3570778</sourcerecordid><originalsourceid>FETCH-LOGICAL-c229t-1da5f57dcdf3a611829779538b931a9417f8e99519bcd4910fe5d014a80b29c23</originalsourceid><addsrcrecordid>eNotUEtLxDAYDKLgunrwH-TqoWu-pGnyHZei68ouHtRzSfOASh9L0ir-e7vY0wwzwzAMIffANgA5PsJGSMWU0hdkBSh0ViihLhcudcGvyU1KX4wVc1ytyG5L35tuas3YDD0th-5kYpNmWvvxx_uevk69PXutT4ma3tF9_-1jmpXsODhPj9Pu-ekj3ZKrYNrk7xZck89ZLl-yw9tuX24PmeUcxwyckUEqZ10QZp6gOSqFUugaBRjMQQXtESVgbV2OwIKXjkFuNKs5Wi7W5OG_18YhpehDdYpNZ-JvBaw6P1BBtTwg_gBUxkzn</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>A Simulation Comparison between Junctionless and Inversion-Mode MuGFETs</title><source>IOP Publishing Journals</source><source>Institute of Physics (IOP) Journals - HEAL-Link</source><creator>Colinge, Jean-Pierre ; Kranti, Abhinav ; Yan, Ran ; Ferain, Isabelle ; Dehdashti Akhavan, Nima ; Razavi, Pedram ; Lee, Chi-Woo ; Yu, Ran ; Colinge, Cindy</creator><creatorcontrib>Colinge, Jean-Pierre ; Kranti, Abhinav ; Yan, Ran ; Ferain, Isabelle ; Dehdashti Akhavan, Nima ; Razavi, Pedram ; Lee, Chi-Woo ; Yu, Ran ; Colinge, Cindy</creatorcontrib><description>A new type of multigate MOSFET, called the junctionless nanowire transistor (JNT), has recently been proposed. It avoids junction formation problem and can be used to make very short-channel devices. Here, we compare the properties and performances of junctionless nanowire transistors with those of with Π-gate inversion-mode (IM) devices. The performances of silicon JNTs and IM transistors are evaluated in terms of short-channel effects, current drive, and gate capacitance. Junctionless devices are shown to have smaller short-channel effects than inversion-mode transistors with junctions. Comparison of carrier transport in the channel is made between junctionless nanowires and inversion-mode multigate field-effect transistors, and the benefits/drawbacks of bulk transport vs. surface transport are addressed.</description><identifier>ISSN: 1938-5862</identifier><identifier>EISSN: 1938-6737</identifier><identifier>DOI: 10.1149/1.3570778</identifier><language>eng</language><ispartof>ECS transactions, 2011, Vol.35 (5), p.63-72</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c229t-1da5f57dcdf3a611829779538b931a9417f8e99519bcd4910fe5d014a80b29c23</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27923,27924</link.rule.ids></links><search><creatorcontrib>Colinge, Jean-Pierre</creatorcontrib><creatorcontrib>Kranti, Abhinav</creatorcontrib><creatorcontrib>Yan, Ran</creatorcontrib><creatorcontrib>Ferain, Isabelle</creatorcontrib><creatorcontrib>Dehdashti Akhavan, Nima</creatorcontrib><creatorcontrib>Razavi, Pedram</creatorcontrib><creatorcontrib>Lee, Chi-Woo</creatorcontrib><creatorcontrib>Yu, Ran</creatorcontrib><creatorcontrib>Colinge, Cindy</creatorcontrib><title>A Simulation Comparison between Junctionless and Inversion-Mode MuGFETs</title><title>ECS transactions</title><description>A new type of multigate MOSFET, called the junctionless nanowire transistor (JNT), has recently been proposed. It avoids junction formation problem and can be used to make very short-channel devices. Here, we compare the properties and performances of junctionless nanowire transistors with those of with Π-gate inversion-mode (IM) devices. The performances of silicon JNTs and IM transistors are evaluated in terms of short-channel effects, current drive, and gate capacitance. Junctionless devices are shown to have smaller short-channel effects than inversion-mode transistors with junctions. Comparison of carrier transport in the channel is made between junctionless nanowires and inversion-mode multigate field-effect transistors, and the benefits/drawbacks of bulk transport vs. surface transport are addressed.</description><issn>1938-5862</issn><issn>1938-6737</issn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2011</creationdate><recordtype>conference_proceeding</recordtype><recordid>eNotUEtLxDAYDKLgunrwH-TqoWu-pGnyHZei68ouHtRzSfOASh9L0ir-e7vY0wwzwzAMIffANgA5PsJGSMWU0hdkBSh0ViihLhcudcGvyU1KX4wVc1ytyG5L35tuas3YDD0th-5kYpNmWvvxx_uevk69PXutT4ma3tF9_-1jmpXsODhPj9Pu-ekj3ZKrYNrk7xZck89ZLl-yw9tuX24PmeUcxwyckUEqZ10QZp6gOSqFUugaBRjMQQXtESVgbV2OwIKXjkFuNKs5Wi7W5OG_18YhpehDdYpNZ-JvBaw6P1BBtTwg_gBUxkzn</recordid><startdate>20110101</startdate><enddate>20110101</enddate><creator>Colinge, Jean-Pierre</creator><creator>Kranti, Abhinav</creator><creator>Yan, Ran</creator><creator>Ferain, Isabelle</creator><creator>Dehdashti Akhavan, Nima</creator><creator>Razavi, Pedram</creator><creator>Lee, Chi-Woo</creator><creator>Yu, Ran</creator><creator>Colinge, Cindy</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20110101</creationdate><title>A Simulation Comparison between Junctionless and Inversion-Mode MuGFETs</title><author>Colinge, Jean-Pierre ; Kranti, Abhinav ; Yan, Ran ; Ferain, Isabelle ; Dehdashti Akhavan, Nima ; Razavi, Pedram ; Lee, Chi-Woo ; Yu, Ran ; Colinge, Cindy</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c229t-1da5f57dcdf3a611829779538b931a9417f8e99519bcd4910fe5d014a80b29c23</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2011</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Colinge, Jean-Pierre</creatorcontrib><creatorcontrib>Kranti, Abhinav</creatorcontrib><creatorcontrib>Yan, Ran</creatorcontrib><creatorcontrib>Ferain, Isabelle</creatorcontrib><creatorcontrib>Dehdashti Akhavan, Nima</creatorcontrib><creatorcontrib>Razavi, Pedram</creatorcontrib><creatorcontrib>Lee, Chi-Woo</creatorcontrib><creatorcontrib>Yu, Ran</creatorcontrib><creatorcontrib>Colinge, Cindy</creatorcontrib><collection>CrossRef</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Colinge, Jean-Pierre</au><au>Kranti, Abhinav</au><au>Yan, Ran</au><au>Ferain, Isabelle</au><au>Dehdashti Akhavan, Nima</au><au>Razavi, Pedram</au><au>Lee, Chi-Woo</au><au>Yu, Ran</au><au>Colinge, Cindy</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>A Simulation Comparison between Junctionless and Inversion-Mode MuGFETs</atitle><btitle>ECS transactions</btitle><date>2011-01-01</date><risdate>2011</risdate><volume>35</volume><issue>5</issue><spage>63</spage><epage>72</epage><pages>63-72</pages><issn>1938-5862</issn><eissn>1938-6737</eissn><abstract>A new type of multigate MOSFET, called the junctionless nanowire transistor (JNT), has recently been proposed. It avoids junction formation problem and can be used to make very short-channel devices. Here, we compare the properties and performances of junctionless nanowire transistors with those of with Π-gate inversion-mode (IM) devices. The performances of silicon JNTs and IM transistors are evaluated in terms of short-channel effects, current drive, and gate capacitance. Junctionless devices are shown to have smaller short-channel effects than inversion-mode transistors with junctions. Comparison of carrier transport in the channel is made between junctionless nanowires and inversion-mode multigate field-effect transistors, and the benefits/drawbacks of bulk transport vs. surface transport are addressed.</abstract><doi>10.1149/1.3570778</doi><tpages>10</tpages></addata></record> |
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title | A Simulation Comparison between Junctionless and Inversion-Mode MuGFETs |
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