Carbon-Modified Titanium Dioxide Deposited by E-Beam Aiming Hydrogen Sensing

Titanium dioxide films deposited by e-beam evaporation were analyzed by ellipsometry, Atomic force microscopy (AFM), Rutherford Backscattering Spectrometry (RBS) and, Energy-Dispersive X-ray Spectroscopy (EDS) and Wavelength-Dispersive X-Ray Spectroscopy (WDX) conducted in a Scanning Electron Micros...

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Bibliographische Detailangaben

Hauptverfasser:	Stem, Nair, Dos Santos Filho, Sebastião G.
Format:	Tagungsbericht
Sprache:	eng
Online-Zugang:	Volltext
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