Influence of H2S Poisoning on Anode Layer of SOFC

The influence of sulfur compounds on Ni-YSZ anode of SOFC cell has investigated by measuring cell voltage under a constant current density for Ni-YSZ anode / YSZ electrolyte / (La,Sr) MnO3 cathode cell. Two-step degradation of cell voltage was observed by supplying H2S contained fuel. The first-step...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Ishikura, Akira, Sakuno, Shinichi, Komiyama, Norio, Sasatsu, Hiroshi, Masuyama, Naoto, Itoh, Hibiki, Yasumoto, Kenji
Format: Tagungsbericht
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 850
container_issue 1
container_start_page 845
container_title
container_volume 7
creator Ishikura, Akira
Sakuno, Shinichi
Komiyama, Norio
Sasatsu, Hiroshi
Masuyama, Naoto
Itoh, Hibiki
Yasumoto, Kenji
description The influence of sulfur compounds on Ni-YSZ anode of SOFC cell has investigated by measuring cell voltage under a constant current density for Ni-YSZ anode / YSZ electrolyte / (La,Sr) MnO3 cathode cell. Two-step degradation of cell voltage was observed by supplying H2S contained fuel. The first-step degradation of cell voltage was recovered completely by switched to sulfur-free fuel, while the cell voltage wasn't recovered completely once the cell voltage went down under 0V. After the cell with irreversible degradation was cooled down under pure N2 atmosphere, it was analyzed by FE-SEM, EDX and Raman Spectroscopy. The results of these analyses of cross-section of the cell revealed nickel sulfides formation by supplying H2S contained fuel. It is supposed that melted nickel sulfides diffused in the anode and electrolyte layer. The irreversible cell poisoning might be caused by these nickel sulfides.
doi_str_mv 10.1149/1.2729174
format Conference Proceeding
fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1149_1_2729174</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1149_1_2729174</sourcerecordid><originalsourceid>FETCH-LOGICAL-c229t-9ee5a2de4c53ce518771bb55ac2edd76c33df11c6b2fbdd9a9ef66167cb50f733</originalsourceid><addsrcrecordid>eNotj8FKAzEURYMoWKsL_yBbF1PzkkkyWZbB2sJAheo6ZJIXGamJJLro32txVvfCPVw4hNwDWwG05hFWXHMDur0gCzCia5QW-nLuslP8mtzU-sGY-sP1gsAuxeMPJo80R7rlB_qSp5rTlN5pTnSdckA6uBOW837Yb_pbchXdseLdnEvytnl67bfNsH_e9euh8Zyb78YgSscDtl4KjxI6rWEcpXSeYwhaeSFCBPBq5HEMwTiDUSlQ2o-SRS3Ekjz8__qSay0Y7VeZPl05WWD27GrBzq7iFz1fRNI</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Influence of H2S Poisoning on Anode Layer of SOFC</title><source>IOP Publishing Journals</source><source>Institute of Physics (IOP) Journals - HEAL-Link</source><creator>Ishikura, Akira ; Sakuno, Shinichi ; Komiyama, Norio ; Sasatsu, Hiroshi ; Masuyama, Naoto ; Itoh, Hibiki ; Yasumoto, Kenji</creator><creatorcontrib>Ishikura, Akira ; Sakuno, Shinichi ; Komiyama, Norio ; Sasatsu, Hiroshi ; Masuyama, Naoto ; Itoh, Hibiki ; Yasumoto, Kenji</creatorcontrib><description>The influence of sulfur compounds on Ni-YSZ anode of SOFC cell has investigated by measuring cell voltage under a constant current density for Ni-YSZ anode / YSZ electrolyte / (La,Sr) MnO3 cathode cell. Two-step degradation of cell voltage was observed by supplying H2S contained fuel. The first-step degradation of cell voltage was recovered completely by switched to sulfur-free fuel, while the cell voltage wasn't recovered completely once the cell voltage went down under 0V. After the cell with irreversible degradation was cooled down under pure N2 atmosphere, it was analyzed by FE-SEM, EDX and Raman Spectroscopy. The results of these analyses of cross-section of the cell revealed nickel sulfides formation by supplying H2S contained fuel. It is supposed that melted nickel sulfides diffused in the anode and electrolyte layer. The irreversible cell poisoning might be caused by these nickel sulfides.</description><identifier>ISSN: 1938-5862</identifier><identifier>EISSN: 1938-6737</identifier><identifier>DOI: 10.1149/1.2729174</identifier><language>eng</language><ispartof>ECS transactions, 2007, Vol.7 (1), p.845-850</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c229t-9ee5a2de4c53ce518771bb55ac2edd76c33df11c6b2fbdd9a9ef66167cb50f733</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27903,27904</link.rule.ids></links><search><creatorcontrib>Ishikura, Akira</creatorcontrib><creatorcontrib>Sakuno, Shinichi</creatorcontrib><creatorcontrib>Komiyama, Norio</creatorcontrib><creatorcontrib>Sasatsu, Hiroshi</creatorcontrib><creatorcontrib>Masuyama, Naoto</creatorcontrib><creatorcontrib>Itoh, Hibiki</creatorcontrib><creatorcontrib>Yasumoto, Kenji</creatorcontrib><title>Influence of H2S Poisoning on Anode Layer of SOFC</title><title>ECS transactions</title><description>The influence of sulfur compounds on Ni-YSZ anode of SOFC cell has investigated by measuring cell voltage under a constant current density for Ni-YSZ anode / YSZ electrolyte / (La,Sr) MnO3 cathode cell. Two-step degradation of cell voltage was observed by supplying H2S contained fuel. The first-step degradation of cell voltage was recovered completely by switched to sulfur-free fuel, while the cell voltage wasn't recovered completely once the cell voltage went down under 0V. After the cell with irreversible degradation was cooled down under pure N2 atmosphere, it was analyzed by FE-SEM, EDX and Raman Spectroscopy. The results of these analyses of cross-section of the cell revealed nickel sulfides formation by supplying H2S contained fuel. It is supposed that melted nickel sulfides diffused in the anode and electrolyte layer. The irreversible cell poisoning might be caused by these nickel sulfides.</description><issn>1938-5862</issn><issn>1938-6737</issn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2007</creationdate><recordtype>conference_proceeding</recordtype><recordid>eNotj8FKAzEURYMoWKsL_yBbF1PzkkkyWZbB2sJAheo6ZJIXGamJJLro32txVvfCPVw4hNwDWwG05hFWXHMDur0gCzCia5QW-nLuslP8mtzU-sGY-sP1gsAuxeMPJo80R7rlB_qSp5rTlN5pTnSdckA6uBOW837Yb_pbchXdseLdnEvytnl67bfNsH_e9euh8Zyb78YgSscDtl4KjxI6rWEcpXSeYwhaeSFCBPBq5HEMwTiDUSlQ2o-SRS3Ekjz8__qSay0Y7VeZPl05WWD27GrBzq7iFz1fRNI</recordid><startdate>20070101</startdate><enddate>20070101</enddate><creator>Ishikura, Akira</creator><creator>Sakuno, Shinichi</creator><creator>Komiyama, Norio</creator><creator>Sasatsu, Hiroshi</creator><creator>Masuyama, Naoto</creator><creator>Itoh, Hibiki</creator><creator>Yasumoto, Kenji</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20070101</creationdate><title>Influence of H2S Poisoning on Anode Layer of SOFC</title><author>Ishikura, Akira ; Sakuno, Shinichi ; Komiyama, Norio ; Sasatsu, Hiroshi ; Masuyama, Naoto ; Itoh, Hibiki ; Yasumoto, Kenji</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c229t-9ee5a2de4c53ce518771bb55ac2edd76c33df11c6b2fbdd9a9ef66167cb50f733</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2007</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Ishikura, Akira</creatorcontrib><creatorcontrib>Sakuno, Shinichi</creatorcontrib><creatorcontrib>Komiyama, Norio</creatorcontrib><creatorcontrib>Sasatsu, Hiroshi</creatorcontrib><creatorcontrib>Masuyama, Naoto</creatorcontrib><creatorcontrib>Itoh, Hibiki</creatorcontrib><creatorcontrib>Yasumoto, Kenji</creatorcontrib><collection>CrossRef</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ishikura, Akira</au><au>Sakuno, Shinichi</au><au>Komiyama, Norio</au><au>Sasatsu, Hiroshi</au><au>Masuyama, Naoto</au><au>Itoh, Hibiki</au><au>Yasumoto, Kenji</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Influence of H2S Poisoning on Anode Layer of SOFC</atitle><btitle>ECS transactions</btitle><date>2007-01-01</date><risdate>2007</risdate><volume>7</volume><issue>1</issue><spage>845</spage><epage>850</epage><pages>845-850</pages><issn>1938-5862</issn><eissn>1938-6737</eissn><abstract>The influence of sulfur compounds on Ni-YSZ anode of SOFC cell has investigated by measuring cell voltage under a constant current density for Ni-YSZ anode / YSZ electrolyte / (La,Sr) MnO3 cathode cell. Two-step degradation of cell voltage was observed by supplying H2S contained fuel. The first-step degradation of cell voltage was recovered completely by switched to sulfur-free fuel, while the cell voltage wasn't recovered completely once the cell voltage went down under 0V. After the cell with irreversible degradation was cooled down under pure N2 atmosphere, it was analyzed by FE-SEM, EDX and Raman Spectroscopy. The results of these analyses of cross-section of the cell revealed nickel sulfides formation by supplying H2S contained fuel. It is supposed that melted nickel sulfides diffused in the anode and electrolyte layer. The irreversible cell poisoning might be caused by these nickel sulfides.</abstract><doi>10.1149/1.2729174</doi><tpages>6</tpages></addata></record>
fulltext fulltext
identifier ISSN: 1938-5862
ispartof ECS transactions, 2007, Vol.7 (1), p.845-850
issn 1938-5862
1938-6737
language eng
recordid cdi_crossref_primary_10_1149_1_2729174
source IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link
title Influence of H2S Poisoning on Anode Layer of SOFC
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-24T09%3A32%3A57IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Influence%20of%20H2S%20Poisoning%20on%20Anode%20Layer%20of%20SOFC&rft.btitle=ECS%20transactions&rft.au=Ishikura,%20Akira&rft.date=2007-01-01&rft.volume=7&rft.issue=1&rft.spage=845&rft.epage=850&rft.pages=845-850&rft.issn=1938-5862&rft.eissn=1938-6737&rft_id=info:doi/10.1149/1.2729174&rft_dat=%3Ccrossref%3E10_1149_1_2729174%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true