Plate In-Plane Electrical Resistance Impact to Stack Performance
In a cell consisting of composite bipolar plates and a polymer electrolyte membrane a significant cell voltage difference has been measured between the reactant inlet end and the reactant outlet end when the cell is aged or defective. In order to gain further understanding, modeling and experimental...
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description | In a cell consisting of composite bipolar plates and a polymer electrolyte membrane a significant cell voltage difference has been measured between the reactant inlet end and the reactant outlet end when the cell is aged or defective. In order to gain further understanding, modeling and experimental studies were conducted simulating the effects of local defects in the MEA. The studies indicate that in the presence of a high local resistance in the MEA or GDL, current bypasses the region creating voltage differences due to high in-plane current. The studies also included incorporating metal plates into the cell with a region of the MEA blocked. In this case, both experimental and modeling results show uniform cell voltage from inlet to outlet. It was concluded that both bipolar plate through-plane electrical resistance and in-plane electrical resistance are important metrics for plate selection and design. |
doi_str_mv | 10.1149/1.2356224 |
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fullrecord | <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1149_1_2356224</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1149_1_2356224</sourcerecordid><originalsourceid>FETCH-LOGICAL-c104t-5c79e1a19f091d23e6ddad16b08349af2a4500d8d529038fdf3a7da706dd61913</originalsourceid><addsrcrecordid>eNotj0tLAzEUhYMoWKsL_0G2Lqbem8wkk51SqhYKllbXwzUPGJ1HSbLx3zvFWZ0PvsOBw9g9wgqxNI-4ErJSQpQXbIFG1oXSUl_OXNVKXLOblL4B1FTXC_a07yh7vh2KCQbPN523ObaWOn7wqU2ZBjvp_kQ28zzyYyb7w_c-hjH2Z3fLrgJ1yd_NuWSfL5uP9Vuxe3_drp93hUUoc1FZbTwSmgAGnZBeOUcO1RfUsjQUBJUVgKtdJQzIOrggSTvSMPUUGpRL9vC_a-OYUvShOcW2p_jbIDTn6w0283X5B5IPSkg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Plate In-Plane Electrical Resistance Impact to Stack Performance</title><source>IOP Publishing Journals</source><source>Institute of Physics (IOP) Journals - HEAL-Link</source><creator>Wang, Guoqing ; Ramani, Manikandan ; Eldrid, Chev</creator><creatorcontrib>Wang, Guoqing ; Ramani, Manikandan ; Eldrid, Chev</creatorcontrib><description>In a cell consisting of composite bipolar plates and a polymer electrolyte membrane a significant cell voltage difference has been measured between the reactant inlet end and the reactant outlet end when the cell is aged or defective. In order to gain further understanding, modeling and experimental studies were conducted simulating the effects of local defects in the MEA. The studies indicate that in the presence of a high local resistance in the MEA or GDL, current bypasses the region creating voltage differences due to high in-plane current. The studies also included incorporating metal plates into the cell with a region of the MEA blocked. In this case, both experimental and modeling results show uniform cell voltage from inlet to outlet. It was concluded that both bipolar plate through-plane electrical resistance and in-plane electrical resistance are important metrics for plate selection and design.</description><identifier>ISSN: 1938-5862</identifier><identifier>EISSN: 1938-6737</identifier><identifier>DOI: 10.1149/1.2356224</identifier><language>eng</language><ispartof>ECS transactions, 2006, Vol.3 (1), p.1049-1056</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,777,781,27905,27906</link.rule.ids></links><search><creatorcontrib>Wang, Guoqing</creatorcontrib><creatorcontrib>Ramani, Manikandan</creatorcontrib><creatorcontrib>Eldrid, Chev</creatorcontrib><title>Plate In-Plane Electrical Resistance Impact to Stack Performance</title><title>ECS transactions</title><description>In a cell consisting of composite bipolar plates and a polymer electrolyte membrane a significant cell voltage difference has been measured between the reactant inlet end and the reactant outlet end when the cell is aged or defective. In order to gain further understanding, modeling and experimental studies were conducted simulating the effects of local defects in the MEA. The studies indicate that in the presence of a high local resistance in the MEA or GDL, current bypasses the region creating voltage differences due to high in-plane current. The studies also included incorporating metal plates into the cell with a region of the MEA blocked. In this case, both experimental and modeling results show uniform cell voltage from inlet to outlet. It was concluded that both bipolar plate through-plane electrical resistance and in-plane electrical resistance are important metrics for plate selection and design.</description><issn>1938-5862</issn><issn>1938-6737</issn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2006</creationdate><recordtype>conference_proceeding</recordtype><recordid>eNotj0tLAzEUhYMoWKsL_0G2Lqbem8wkk51SqhYKllbXwzUPGJ1HSbLx3zvFWZ0PvsOBw9g9wgqxNI-4ErJSQpQXbIFG1oXSUl_OXNVKXLOblL4B1FTXC_a07yh7vh2KCQbPN523ObaWOn7wqU2ZBjvp_kQ28zzyYyb7w_c-hjH2Z3fLrgJ1yd_NuWSfL5uP9Vuxe3_drp93hUUoc1FZbTwSmgAGnZBeOUcO1RfUsjQUBJUVgKtdJQzIOrggSTvSMPUUGpRL9vC_a-OYUvShOcW2p_jbIDTn6w0283X5B5IPSkg</recordid><startdate>20061020</startdate><enddate>20061020</enddate><creator>Wang, Guoqing</creator><creator>Ramani, Manikandan</creator><creator>Eldrid, Chev</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20061020</creationdate><title>Plate In-Plane Electrical Resistance Impact to Stack Performance</title><author>Wang, Guoqing ; Ramani, Manikandan ; Eldrid, Chev</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c104t-5c79e1a19f091d23e6ddad16b08349af2a4500d8d529038fdf3a7da706dd61913</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2006</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Wang, Guoqing</creatorcontrib><creatorcontrib>Ramani, Manikandan</creatorcontrib><creatorcontrib>Eldrid, Chev</creatorcontrib><collection>CrossRef</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wang, Guoqing</au><au>Ramani, Manikandan</au><au>Eldrid, Chev</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Plate In-Plane Electrical Resistance Impact to Stack Performance</atitle><btitle>ECS transactions</btitle><date>2006-10-20</date><risdate>2006</risdate><volume>3</volume><issue>1</issue><spage>1049</spage><epage>1056</epage><pages>1049-1056</pages><issn>1938-5862</issn><eissn>1938-6737</eissn><abstract>In a cell consisting of composite bipolar plates and a polymer electrolyte membrane a significant cell voltage difference has been measured between the reactant inlet end and the reactant outlet end when the cell is aged or defective. In order to gain further understanding, modeling and experimental studies were conducted simulating the effects of local defects in the MEA. The studies indicate that in the presence of a high local resistance in the MEA or GDL, current bypasses the region creating voltage differences due to high in-plane current. The studies also included incorporating metal plates into the cell with a region of the MEA blocked. In this case, both experimental and modeling results show uniform cell voltage from inlet to outlet. It was concluded that both bipolar plate through-plane electrical resistance and in-plane electrical resistance are important metrics for plate selection and design.</abstract><doi>10.1149/1.2356224</doi><tpages>8</tpages></addata></record> |
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identifier | ISSN: 1938-5862 |
ispartof | ECS transactions, 2006, Vol.3 (1), p.1049-1056 |
issn | 1938-5862 1938-6737 |
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source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
title | Plate In-Plane Electrical Resistance Impact to Stack Performance |
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