Durability and Reliability in High-Temperature Reformed Hydrogen PEFCs

Durability and Reliability in High-Temperature Reformed Hydrogen PEFCs

This work summarizes the effect of carbon monoxide and hydrogen sulfide on the cell potential of a high temperature Celtec® P1000 MEA. We could demonstrate a H2S tolerance of at least 10 ppm, a value significantly higher than state-of-the-art fuel processor and shift catalysts can tolerate. More tha...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Schmidt, Thomas J., Baurmeister, Jochen
Format: Tagungsbericht
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 869
container_issue 1
container_start_page 861
container_title
container_volume 3
creator Schmidt, Thomas J.
Baurmeister, Jochen
description This work summarizes the effect of carbon monoxide and hydrogen sulfide on the cell potential of a high temperature Celtec® P1000 MEA. We could demonstrate a H2S tolerance of at least 10 ppm, a value significantly higher than state-of-the-art fuel processor and shift catalysts can tolerate. More than 3000 hours operation in reformate with 5ppm H2S and 2% CO is proven. Under certain conditions poisoning from both CO and H2S are just additive, which represent valuable conditions for sustained and stable cell voltage. On the other hand, in a region where effects from H2S and CO contaminants are not additive, the anode typically becomes rapidly poisoned
doi_str_mv 10.1149/1.2356204
format Conference Proceeding
fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1149_1_2356204</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1149_1_2356204</sourcerecordid><originalsourceid>FETCH-LOGICAL-c144t-8af9d1e7ab6406252f8a2aa816cce77e856fba9035f46df7345c0949805faa33</originalsourceid><addsrcrecordid>eNo1j0tLw0AcxBdRsFYPfoNcPaTu-3GU2DRCwVJyD_8ku3Ulj7KbHvLtrRhPM8MMAz-EngneEMLNK9lQJiTF_AatiGE6lYqp28ULLek9eojxG2N5nasVyt8vAWrf-WlOYGiTo-38f_ZDUvjTV1ra_mwDTJdgr70bQ2_bpJjbMJ7skBy2eRYf0Z2DLtqnRdeozLdlVqT7z91H9rZPG8L5lGpwpiVWQS05llRQp4ECaCKbxipltZCuBoOZcFy2TjEuGmy40Vg4AMbW6OXvtgljjMG66hx8D2GuCK5--StSLfzsB69hTI8</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Durability and Reliability in High-Temperature Reformed Hydrogen PEFCs</title><source>IOP Publishing Journals</source><source>Institute of Physics (IOP) Journals - HEAL-Link</source><creator>Schmidt, Thomas J. ; Baurmeister, Jochen</creator><creatorcontrib>Schmidt, Thomas J. ; Baurmeister, Jochen</creatorcontrib><description>This work summarizes the effect of carbon monoxide and hydrogen sulfide on the cell potential of a high temperature Celtec® P1000 MEA. We could demonstrate a H2S tolerance of at least 10 ppm, a value significantly higher than state-of-the-art fuel processor and shift catalysts can tolerate. More than 3000 hours operation in reformate with 5ppm H2S and 2% CO is proven. Under certain conditions poisoning from both CO and H2S are just additive, which represent valuable conditions for sustained and stable cell voltage. On the other hand, in a region where effects from H2S and CO contaminants are not additive, the anode typically becomes rapidly poisoned</description><identifier>ISSN: 1938-5862</identifier><identifier>EISSN: 1938-6737</identifier><identifier>DOI: 10.1149/1.2356204</identifier><language>eng</language><ispartof>ECS transactions, 2006, Vol.3 (1), p.861-869</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c144t-8af9d1e7ab6406252f8a2aa816cce77e856fba9035f46df7345c0949805faa33</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27923,27924</link.rule.ids></links><search><creatorcontrib>Schmidt, Thomas J.</creatorcontrib><creatorcontrib>Baurmeister, Jochen</creatorcontrib><title>Durability and Reliability in High-Temperature Reformed Hydrogen PEFCs</title><title>ECS transactions</title><description>This work summarizes the effect of carbon monoxide and hydrogen sulfide on the cell potential of a high temperature Celtec® P1000 MEA. We could demonstrate a H2S tolerance of at least 10 ppm, a value significantly higher than state-of-the-art fuel processor and shift catalysts can tolerate. More than 3000 hours operation in reformate with 5ppm H2S and 2% CO is proven. Under certain conditions poisoning from both CO and H2S are just additive, which represent valuable conditions for sustained and stable cell voltage. On the other hand, in a region where effects from H2S and CO contaminants are not additive, the anode typically becomes rapidly poisoned</description><issn>1938-5862</issn><issn>1938-6737</issn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2006</creationdate><recordtype>conference_proceeding</recordtype><recordid>eNo1j0tLw0AcxBdRsFYPfoNcPaTu-3GU2DRCwVJyD_8ku3Ulj7KbHvLtrRhPM8MMAz-EngneEMLNK9lQJiTF_AatiGE6lYqp28ULLek9eojxG2N5nasVyt8vAWrf-WlOYGiTo-38f_ZDUvjTV1ra_mwDTJdgr70bQ2_bpJjbMJ7skBy2eRYf0Z2DLtqnRdeozLdlVqT7z91H9rZPG8L5lGpwpiVWQS05llRQp4ECaCKbxipltZCuBoOZcFy2TjEuGmy40Vg4AMbW6OXvtgljjMG66hx8D2GuCK5--StSLfzsB69hTI8</recordid><startdate>20061020</startdate><enddate>20061020</enddate><creator>Schmidt, Thomas J.</creator><creator>Baurmeister, Jochen</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20061020</creationdate><title>Durability and Reliability in High-Temperature Reformed Hydrogen PEFCs</title><author>Schmidt, Thomas J. ; Baurmeister, Jochen</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c144t-8af9d1e7ab6406252f8a2aa816cce77e856fba9035f46df7345c0949805faa33</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2006</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Schmidt, Thomas J.</creatorcontrib><creatorcontrib>Baurmeister, Jochen</creatorcontrib><collection>CrossRef</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Schmidt, Thomas J.</au><au>Baurmeister, Jochen</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Durability and Reliability in High-Temperature Reformed Hydrogen PEFCs</atitle><btitle>ECS transactions</btitle><date>2006-10-20</date><risdate>2006</risdate><volume>3</volume><issue>1</issue><spage>861</spage><epage>869</epage><pages>861-869</pages><issn>1938-5862</issn><eissn>1938-6737</eissn><abstract>This work summarizes the effect of carbon monoxide and hydrogen sulfide on the cell potential of a high temperature Celtec® P1000 MEA. We could demonstrate a H2S tolerance of at least 10 ppm, a value significantly higher than state-of-the-art fuel processor and shift catalysts can tolerate. More than 3000 hours operation in reformate with 5ppm H2S and 2% CO is proven. Under certain conditions poisoning from both CO and H2S are just additive, which represent valuable conditions for sustained and stable cell voltage. On the other hand, in a region where effects from H2S and CO contaminants are not additive, the anode typically becomes rapidly poisoned</abstract><doi>10.1149/1.2356204</doi><tpages>9</tpages></addata></record>
fulltext fulltext
identifier ISSN: 1938-5862
ispartof ECS transactions, 2006, Vol.3 (1), p.861-869
issn 1938-5862
1938-6737
language eng
recordid cdi_crossref_primary_10_1149_1_2356204
source IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link
title Durability and Reliability in High-Temperature Reformed Hydrogen PEFCs
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-08T13%3A39%3A07IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Durability%20and%20Reliability%20in%20High-Temperature%20Reformed%20Hydrogen%20PEFCs&rft.btitle=ECS%20transactions&rft.au=Schmidt,%20Thomas%20J.&rft.date=2006-10-20&rft.volume=3&rft.issue=1&rft.spage=861&rft.epage=869&rft.pages=861-869&rft.issn=1938-5862&rft.eissn=1938-6737&rft_id=info:doi/10.1149/1.2356204&rft_dat=%3Ccrossref%3E10_1149_1_2356204%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true