Atomic Layer Deposition and Characterization of HfO[sub 2] Films on Noble Metal Film Substrates
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Veröffentlicht in: | Journal of the Electrochemical Society 2005, Vol.152 (7), p.F75 |
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container_issue | 7 |
container_start_page | F75 |
container_title | Journal of the Electrochemical Society |
container_volume | 152 |
creator | Kukli, Kaupo Aaltonen, Titta Aarik, Jaan Lu, Jun Ritala, Mikko Ferrari, Sandro Hårsta, Anders Leskelä, Markku |
description | |
doi_str_mv | 10.1149/1.1922888 |
format | Article |
fullrecord | <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1149_1_1922888</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1149_1_1922888</sourcerecordid><originalsourceid>FETCH-LOGICAL-c1098-a6e0586efb6853cf8317c12b20c4a06a58ae73b51cf653202d740f23ddf310ba3</originalsourceid><addsrcrecordid>eNotkLFOwzAURT2ARCkM_IFXhhQ_O3acsQqUIgU6ABNC1rNji6C0rux0KF9PKZ2u7hnOcAi5ATYDKOs7mEHNudb6jEwYA1GUSsIFucz5-3BBl9WEmPkY172jLe59ovd-G3M_9nFDcdPR5gsTutGn_gePMAa6DKuPvLOUf9JFP6wzPeCXaAdPn_2IwxHS153NY8LR5ytyHnDI_vq0U_K-eHhrlkW7enxq5m3hgNW6QOWZ1MoHq7QULmgBlQNuOXMlMoVSo6-EleCCkoIz3lUlC1x0XRDALIopuf33uhRzTj6YberXmPYGmPmrYcCcaohfcLJTLg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Atomic Layer Deposition and Characterization of HfO[sub 2] Films on Noble Metal Film Substrates</title><source>IOP Publishing Journals</source><creator>Kukli, Kaupo ; Aaltonen, Titta ; Aarik, Jaan ; Lu, Jun ; Ritala, Mikko ; Ferrari, Sandro ; Hårsta, Anders ; Leskelä, Markku</creator><creatorcontrib>Kukli, Kaupo ; Aaltonen, Titta ; Aarik, Jaan ; Lu, Jun ; Ritala, Mikko ; Ferrari, Sandro ; Hårsta, Anders ; Leskelä, Markku</creatorcontrib><identifier>ISSN: 0013-4651</identifier><identifier>DOI: 10.1149/1.1922888</identifier><language>eng</language><ispartof>Journal of the Electrochemical Society, 2005, Vol.152 (7), p.F75</ispartof><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c1098-a6e0586efb6853cf8317c12b20c4a06a58ae73b51cf653202d740f23ddf310ba3</citedby><cites>FETCH-LOGICAL-c1098-a6e0586efb6853cf8317c12b20c4a06a58ae73b51cf653202d740f23ddf310ba3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,4010,27900,27901,27902</link.rule.ids></links><search><creatorcontrib>Kukli, Kaupo</creatorcontrib><creatorcontrib>Aaltonen, Titta</creatorcontrib><creatorcontrib>Aarik, Jaan</creatorcontrib><creatorcontrib>Lu, Jun</creatorcontrib><creatorcontrib>Ritala, Mikko</creatorcontrib><creatorcontrib>Ferrari, Sandro</creatorcontrib><creatorcontrib>Hårsta, Anders</creatorcontrib><creatorcontrib>Leskelä, Markku</creatorcontrib><title>Atomic Layer Deposition and Characterization of HfO[sub 2] Films on Noble Metal Film Substrates</title><title>Journal of the Electrochemical Society</title><issn>0013-4651</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNotkLFOwzAURT2ARCkM_IFXhhQ_O3acsQqUIgU6ABNC1rNji6C0rux0KF9PKZ2u7hnOcAi5ATYDKOs7mEHNudb6jEwYA1GUSsIFucz5-3BBl9WEmPkY172jLe59ovd-G3M_9nFDcdPR5gsTutGn_gePMAa6DKuPvLOUf9JFP6wzPeCXaAdPn_2IwxHS153NY8LR5ytyHnDI_vq0U_K-eHhrlkW7enxq5m3hgNW6QOWZ1MoHq7QULmgBlQNuOXMlMoVSo6-EleCCkoIz3lUlC1x0XRDALIopuf33uhRzTj6YberXmPYGmPmrYcCcaohfcLJTLg</recordid><startdate>2005</startdate><enddate>2005</enddate><creator>Kukli, Kaupo</creator><creator>Aaltonen, Titta</creator><creator>Aarik, Jaan</creator><creator>Lu, Jun</creator><creator>Ritala, Mikko</creator><creator>Ferrari, Sandro</creator><creator>Hårsta, Anders</creator><creator>Leskelä, Markku</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>2005</creationdate><title>Atomic Layer Deposition and Characterization of HfO[sub 2] Films on Noble Metal Film Substrates</title><author>Kukli, Kaupo ; Aaltonen, Titta ; Aarik, Jaan ; Lu, Jun ; Ritala, Mikko ; Ferrari, Sandro ; Hårsta, Anders ; Leskelä, Markku</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1098-a6e0586efb6853cf8317c12b20c4a06a58ae73b51cf653202d740f23ddf310ba3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kukli, Kaupo</creatorcontrib><creatorcontrib>Aaltonen, Titta</creatorcontrib><creatorcontrib>Aarik, Jaan</creatorcontrib><creatorcontrib>Lu, Jun</creatorcontrib><creatorcontrib>Ritala, Mikko</creatorcontrib><creatorcontrib>Ferrari, Sandro</creatorcontrib><creatorcontrib>Hårsta, Anders</creatorcontrib><creatorcontrib>Leskelä, Markku</creatorcontrib><collection>CrossRef</collection><jtitle>Journal of the Electrochemical Society</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kukli, Kaupo</au><au>Aaltonen, Titta</au><au>Aarik, Jaan</au><au>Lu, Jun</au><au>Ritala, Mikko</au><au>Ferrari, Sandro</au><au>Hårsta, Anders</au><au>Leskelä, Markku</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Atomic Layer Deposition and Characterization of HfO[sub 2] Films on Noble Metal Film Substrates</atitle><jtitle>Journal of the Electrochemical Society</jtitle><date>2005</date><risdate>2005</risdate><volume>152</volume><issue>7</issue><spage>F75</spage><pages>F75-</pages><issn>0013-4651</issn><doi>10.1149/1.1922888</doi><oa>free_for_read</oa></addata></record> |
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language | eng |
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source | IOP Publishing Journals |
title | Atomic Layer Deposition and Characterization of HfO[sub 2] Films on Noble Metal Film Substrates |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-29T22%3A39%3A28IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Atomic%20Layer%20Deposition%20and%20Characterization%20of%20HfO%5Bsub%202%5D%20Films%20on%20Noble%20Metal%20Film%20Substrates&rft.jtitle=Journal%20of%20the%20Electrochemical%20Society&rft.au=Kukli,%20Kaupo&rft.date=2005&rft.volume=152&rft.issue=7&rft.spage=F75&rft.pages=F75-&rft.issn=0013-4651&rft_id=info:doi/10.1149/1.1922888&rft_dat=%3Ccrossref%3E10_1149_1_1922888%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |