A Time Resolved Study of Precoated AISI 441 for SOFC Interconnects Using STEM-EELS - Part I

Precoated AISI441 for SOFC interconnectors were investigated by STEM-EELS looking at the diffusion processes in the initial stage of the oxidation. The electron beam physical vapour deposition (EB-PVD) coating contained Ce and Co/Mn-alloy in two layers with at total thickness of 800 nm. The samples...

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Bibliographische Detailangaben

Hauptverfasser:	Karlsson, Lisa S, Lundberg, Mats W, Berger, Robert, Westlinder, Jörgen
Format:	Tagungsbericht
Sprache:	eng
Online-Zugang:	Volltext
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