Lifetime Characterization of Mc:Si Bricks by Upgraded µ-PCD Technique

A very efficient way is introduced to improve the application of the conventional µ-PCD lifetime mapping technique to bulk photovoltaic grade Si materials (ingots, blocks). The shape of the recorded photoconductance decay curves are strongly impacted by the properties of the laser applied for the el...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Korsós, Ferenc, Jász, Andás
Format:	Tagungsbericht
Sprache:	eng
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!