Chemical Degradation of SOFCs: External Impurity Poisoning and Internal Diffusion-Related Phenomena

Chemical Degradation of SOFCs: External Impurity Poisoning and Internal Diffusion-Related Phenomena

Durability of SOFCs is one of the most important requirements for commercialization. In this paper, we analyze chemical degradation phenomena caused by both extrinsic and intrinsic origins besides by thermal/redox cycling. As external degradation, impurity (sulfur,phosphorus etc.) poisoning has been...

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Veröffentlicht in:ECS transactions 2013-10, Vol.57 (1), p.315-323
Hauptverfasser: Sasaki, Kazunari, Yoshizumi, Tomoo, Haga, Kengo, Yoshitomi, Hiroaki, Hosoi, Takami, Shiratori, Yusuke, Taniguchi, Shunsuke
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container_issue 1
container_start_page 315
container_title ECS transactions
container_volume 57
creator Sasaki, Kazunari
Yoshizumi, Tomoo
Haga, Kengo
Yoshitomi, Hiroaki
Hosoi, Takami
Shiratori, Yusuke
Taniguchi, Shunsuke
description Durability of SOFCs is one of the most important requirements for commercialization. In this paper, we analyze chemical degradation phenomena caused by both extrinsic and intrinsic origins besides by thermal/redox cycling. As external degradation, impurity (sulfur,phosphorus etc.) poisoning has been systematically analyzed and classified based on both thermochemical and kinetic consideration. We present typical intrinsic chemical degradation phenomena observed, mainly diffusion-related processes (interdiffusion, grainboundary diffusion, dopant dissolution, phase transformation etc.) around interfaces between the electrolyte and the electrode, which has been revealed through high-resolution STEM-EDX analysis of cells after long-term operation. Degradation mechanisms have been classified.
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fullrecord <record><control><sourceid>iop_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1149_05701_0315ecst</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10.1149/05701.0315ecst</sourcerecordid><originalsourceid>FETCH-LOGICAL-c340t-ab11129a4c7060d22006bc18741b20532bf118afca59455455526a65c27a83d13</originalsourceid><addsrcrecordid>eNp1kM1rAjEQxUNpodb22nPOhbWZZLPZ7a2s2gqC0o_zks0mGnETSVao_71rtcfCwAy8-Q1vHkKPQEYAafFMuCAwIgy4VrG7QgMoWJ5kgonry8zzjN6iuxg3hGQ9IwZIlWvdWiW3eKxXQTays95hb_DnYlrGFzz56XRwvTxrd_tguwNeehu9s26FpWvwzF30sTVmH3s4-dBb2ekGL9fa-VY7eY9ujNxG_XDpQ_Q9nXyV78l88TYrX-eJYinpElkDAC1kqgTJSENpb7JWkIsUako4o7UByKVRkhcp531xmsmMKypkzhpgQzQ631XBxxi0qXbBtjIcKiDVKaLqN6LqL6IeeDoD1u-qjd-fHon_LR8BQf5nIw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Chemical Degradation of SOFCs: External Impurity Poisoning and Internal Diffusion-Related Phenomena</title><source>IOP Publishing Journals</source><source>Institute of Physics (IOP) Journals - HEAL-Link</source><creator>Sasaki, Kazunari ; Yoshizumi, Tomoo ; Haga, Kengo ; Yoshitomi, Hiroaki ; Hosoi, Takami ; Shiratori, Yusuke ; Taniguchi, Shunsuke</creator><creatorcontrib>Sasaki, Kazunari ; Yoshizumi, Tomoo ; Haga, Kengo ; Yoshitomi, Hiroaki ; Hosoi, Takami ; Shiratori, Yusuke ; Taniguchi, Shunsuke</creatorcontrib><description>Durability of SOFCs is one of the most important requirements for commercialization. In this paper, we analyze chemical degradation phenomena caused by both extrinsic and intrinsic origins besides by thermal/redox cycling. As external degradation, impurity (sulfur,phosphorus etc.) poisoning has been systematically analyzed and classified based on both thermochemical and kinetic consideration. We present typical intrinsic chemical degradation phenomena observed, mainly diffusion-related processes (interdiffusion, grainboundary diffusion, dopant dissolution, phase transformation etc.) around interfaces between the electrolyte and the electrode, which has been revealed through high-resolution STEM-EDX analysis of cells after long-term operation. Degradation mechanisms have been classified.</description><identifier>ISSN: 1938-5862</identifier><identifier>EISSN: 1938-6737</identifier><identifier>DOI: 10.1149/05701.0315ecst</identifier><language>eng</language><publisher>The Electrochemical Society, Inc</publisher><ispartof>ECS transactions, 2013-10, Vol.57 (1), p.315-323</ispartof><rights>2013 ECS - The Electrochemical Society</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c340t-ab11129a4c7060d22006bc18741b20532bf118afca59455455526a65c27a83d13</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.1149/05701.0315ecst/pdf$$EPDF$$P50$$Giop$$H</linktopdf><link.rule.ids>314,780,784,27924,27925,53846,53893</link.rule.ids></links><search><creatorcontrib>Sasaki, Kazunari</creatorcontrib><creatorcontrib>Yoshizumi, Tomoo</creatorcontrib><creatorcontrib>Haga, Kengo</creatorcontrib><creatorcontrib>Yoshitomi, Hiroaki</creatorcontrib><creatorcontrib>Hosoi, Takami</creatorcontrib><creatorcontrib>Shiratori, Yusuke</creatorcontrib><creatorcontrib>Taniguchi, Shunsuke</creatorcontrib><title>Chemical Degradation of SOFCs: External Impurity Poisoning and Internal Diffusion-Related Phenomena</title><title>ECS transactions</title><addtitle>ECS Trans</addtitle><description>Durability of SOFCs is one of the most important requirements for commercialization. In this paper, we analyze chemical degradation phenomena caused by both extrinsic and intrinsic origins besides by thermal/redox cycling. As external degradation, impurity (sulfur,phosphorus etc.) poisoning has been systematically analyzed and classified based on both thermochemical and kinetic consideration. We present typical intrinsic chemical degradation phenomena observed, mainly diffusion-related processes (interdiffusion, grainboundary diffusion, dopant dissolution, phase transformation etc.) around interfaces between the electrolyte and the electrode, which has been revealed through high-resolution STEM-EDX analysis of cells after long-term operation. Degradation mechanisms have been classified.</description><issn>1938-5862</issn><issn>1938-6737</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><recordid>eNp1kM1rAjEQxUNpodb22nPOhbWZZLPZ7a2s2gqC0o_zks0mGnETSVao_71rtcfCwAy8-Q1vHkKPQEYAafFMuCAwIgy4VrG7QgMoWJ5kgonry8zzjN6iuxg3hGQ9IwZIlWvdWiW3eKxXQTays95hb_DnYlrGFzz56XRwvTxrd_tguwNeehu9s26FpWvwzF30sTVmH3s4-dBb2ekGL9fa-VY7eY9ujNxG_XDpQ_Q9nXyV78l88TYrX-eJYinpElkDAC1kqgTJSENpb7JWkIsUako4o7UByKVRkhcp531xmsmMKypkzhpgQzQ631XBxxi0qXbBtjIcKiDVKaLqN6LqL6IeeDoD1u-qjd-fHon_LR8BQf5nIw</recordid><startdate>20131006</startdate><enddate>20131006</enddate><creator>Sasaki, Kazunari</creator><creator>Yoshizumi, Tomoo</creator><creator>Haga, Kengo</creator><creator>Yoshitomi, Hiroaki</creator><creator>Hosoi, Takami</creator><creator>Shiratori, Yusuke</creator><creator>Taniguchi, Shunsuke</creator><general>The Electrochemical Society, Inc</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20131006</creationdate><title>Chemical Degradation of SOFCs: External Impurity Poisoning and Internal Diffusion-Related Phenomena</title><author>Sasaki, Kazunari ; Yoshizumi, Tomoo ; Haga, Kengo ; Yoshitomi, Hiroaki ; Hosoi, Takami ; Shiratori, Yusuke ; Taniguchi, Shunsuke</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c340t-ab11129a4c7060d22006bc18741b20532bf118afca59455455526a65c27a83d13</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Sasaki, Kazunari</creatorcontrib><creatorcontrib>Yoshizumi, Tomoo</creatorcontrib><creatorcontrib>Haga, Kengo</creatorcontrib><creatorcontrib>Yoshitomi, Hiroaki</creatorcontrib><creatorcontrib>Hosoi, Takami</creatorcontrib><creatorcontrib>Shiratori, Yusuke</creatorcontrib><creatorcontrib>Taniguchi, Shunsuke</creatorcontrib><collection>CrossRef</collection><jtitle>ECS transactions</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Sasaki, Kazunari</au><au>Yoshizumi, Tomoo</au><au>Haga, Kengo</au><au>Yoshitomi, Hiroaki</au><au>Hosoi, Takami</au><au>Shiratori, Yusuke</au><au>Taniguchi, Shunsuke</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Chemical Degradation of SOFCs: External Impurity Poisoning and Internal Diffusion-Related Phenomena</atitle><jtitle>ECS transactions</jtitle><addtitle>ECS Trans</addtitle><date>2013-10-06</date><risdate>2013</risdate><volume>57</volume><issue>1</issue><spage>315</spage><epage>323</epage><pages>315-323</pages><issn>1938-5862</issn><eissn>1938-6737</eissn><abstract>Durability of SOFCs is one of the most important requirements for commercialization. In this paper, we analyze chemical degradation phenomena caused by both extrinsic and intrinsic origins besides by thermal/redox cycling. As external degradation, impurity (sulfur,phosphorus etc.) poisoning has been systematically analyzed and classified based on both thermochemical and kinetic consideration. We present typical intrinsic chemical degradation phenomena observed, mainly diffusion-related processes (interdiffusion, grainboundary diffusion, dopant dissolution, phase transformation etc.) around interfaces between the electrolyte and the electrode, which has been revealed through high-resolution STEM-EDX analysis of cells after long-term operation. Degradation mechanisms have been classified.</abstract><pub>The Electrochemical Society, Inc</pub><doi>10.1149/05701.0315ecst</doi><tpages>9</tpages></addata></record>
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title Chemical Degradation of SOFCs: External Impurity Poisoning and Internal Diffusion-Related Phenomena
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T03%3A52%3A19IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-iop_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Chemical%20Degradation%20of%20SOFCs:%20External%20Impurity%20Poisoning%20and%20Internal%20Diffusion-Related%20Phenomena&rft.jtitle=ECS%20transactions&rft.au=Sasaki,%20Kazunari&rft.date=2013-10-06&rft.volume=57&rft.issue=1&rft.spage=315&rft.epage=323&rft.pages=315-323&rft.issn=1938-5862&rft.eissn=1938-6737&rft_id=info:doi/10.1149/05701.0315ecst&rft_dat=%3Ciop_cross%3E10.1149/05701.0315ecst%3C/iop_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true