Few-Shot Object Detection: A Survey
Deep learning approaches have recently raised the bar in many fields, from Natural Language Processing to Computer Vision, by leveraging large amounts of data. However, they could fail when the retrieved information is not enough to fit the vast number of parameters, frequently resulting in overfitt...
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Veröffentlicht in: | ACM computing surveys 2022-09, Vol.54 (11s), p.1-37, Article 242 |
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