Digital Fault-based Built-in Self-test and Evaluation of Low Dropout Voltage Regulators

With increasing pressure to obtain near-zero defect rates, there is a need to explore built-in self-test and other non-traditional test techniques for embedded mixed-signal components, such as PLLs, power converters, and data converters. This article presents an extremely low-cost built-in self-test...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	ACM journal on emerging technologies in computing systems 2022-08, Vol.18 (3), p.1-20, Article 54
Hauptverfasser:	Ince, Mehmet, Bilgic, Bora, Ozev, Sule
Format:	Artikel
Sprache:	eng
Schlagworte:	Analog, mixed-signal and radio frequency test Defect-based test Hardware Malicious design modifications Security and privacy
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!