Defects, Fault Modeling, and Test Development Framework for RRAMs

Resistive RAM (RRAM) is a promising technology to replace traditional technologies such as Flash, because of its low energy consumption, CMOS compatibility, and high density. Many companies are prototyping this technology to validate its potential. Bringing this technology to the market requires hig...

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Veröffentlicht in:	ACM journal on emerging technologies in computing systems 2022-04, Vol.18 (3), p.1-26, Article 52
Hauptverfasser:	Fieback, Moritz, Medeiros, Guilherme Cardoso, Wu, Lizhou, Aziza, Hassen, Bishnoi, Rajendra, Taouil, Mottaqiallah, Hamdioui, Said
Format:	Artikel
Sprache:	eng
Schlagworte:	Defect-based test Fault models and test metrics Hardware Memory test and repair Test-pattern generation and fault simulation
Online-Zugang:	Volltext
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