System Identification Using Embedded Dynamic Signal Analyzer

The effect of model uncertainty is increased in optical disc drives (ODDs) because the mechanical and electrical components are manufactured with a wide error tolerance to reduce production costs. In this paper, we introduce a new technique for system identification whereby an embedded dynamic signa...

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Veröffentlicht in:Japanese Journal of Applied Physics 2012-08, Vol.51 (8), p.08JB02-08JB02-6
Hauptverfasser: Kim, Soo-Yong, Koo, Keunhwi, Huh, Junho, Cho, Hyeonwoo, Kim, Sang Woo
Format: Artikel
Sprache:eng
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