Off-Axis Diffractive Focusing Reflectors for Refractive Index Sensing in Microfluidic Devices
Microfluidic devices with off-axis diffractive focusing reflectors (DFRs) were fabricated for refractive index sensing in biological and chemical fields. Such devices can detect refractive index changes of dielectric liquid samples just above the DFRs by measuring the changes of diffracted power fro...
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| Veröffentlicht in: | Japanese Journal of Applied Physics 2011-06, Vol.50 (6), p.06GL02-06GL02-3 |
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| container_end_page | 06GL02-3 |
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| container_issue | 6 |
| container_start_page | 06GL02 |
| container_title | Japanese Journal of Applied Physics |
| container_volume | 50 |
| creator | Nishiyama, Hiroaki Sagawa, Yu-ichi Furukawa, Norihiro Okamoto, Shintaro Hirata, Yoshinori Nishii, Junji |
| description | Microfluidic devices with off-axis diffractive focusing reflectors (DFRs) were fabricated for refractive index sensing in biological and chemical fields. Such devices can detect refractive index changes of dielectric liquid samples just above the DFRs by measuring the changes of diffracted power from the fluidic devices. The focusing reflectors consist of curved SiO 2 lines with periods which gradually varied from 1.23 to 3.73 μm. When a probe laser with 632.8 nm wavelength was coupled to the DFRs at the off-axis angle of 20°, a focal spot of 3.5 μm was observed at the distance of 1000 μm from the lens surface, which was close to theoretical value. |
| doi_str_mv | 10.1143/JJAP.50.06GL02 |
| format | Article |
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Such devices can detect refractive index changes of dielectric liquid samples just above the DFRs by measuring the changes of diffracted power from the fluidic devices. The focusing reflectors consist of curved SiO 2 lines with periods which gradually varied from 1.23 to 3.73 μm. When a probe laser with 632.8 nm wavelength was coupled to the DFRs at the off-axis angle of 20°, a focal spot of 3.5 μm was observed at the distance of 1000 μm from the lens surface, which was close to theoretical value.</description><identifier>ISSN: 0021-4922</identifier><identifier>EISSN: 1347-4065</identifier><identifier>DOI: 10.1143/JJAP.50.06GL02</identifier><language>eng</language><publisher>The Japan Society of Applied Physics</publisher><ispartof>Japanese Journal of Applied Physics, 2011-06, Vol.50 (6), p.06GL02-06GL02-3</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c295t-3b14c4c88123d00cf885635392ffc592c11bfe4dd3960e8cc1ea8d14f3e7f8d03</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>315,781,785,27928,27929</link.rule.ids></links><search><creatorcontrib>Nishiyama, Hiroaki</creatorcontrib><creatorcontrib>Sagawa, Yu-ichi</creatorcontrib><creatorcontrib>Furukawa, Norihiro</creatorcontrib><creatorcontrib>Okamoto, Shintaro</creatorcontrib><creatorcontrib>Hirata, Yoshinori</creatorcontrib><creatorcontrib>Nishii, Junji</creatorcontrib><title>Off-Axis Diffractive Focusing Reflectors for Refractive Index Sensing in Microfluidic Devices</title><title>Japanese Journal of Applied Physics</title><description>Microfluidic devices with off-axis diffractive focusing reflectors (DFRs) were fabricated for refractive index sensing in biological and chemical fields. Such devices can detect refractive index changes of dielectric liquid samples just above the DFRs by measuring the changes of diffracted power from the fluidic devices. The focusing reflectors consist of curved SiO 2 lines with periods which gradually varied from 1.23 to 3.73 μm. 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Such devices can detect refractive index changes of dielectric liquid samples just above the DFRs by measuring the changes of diffracted power from the fluidic devices. The focusing reflectors consist of curved SiO 2 lines with periods which gradually varied from 1.23 to 3.73 μm. When a probe laser with 632.8 nm wavelength was coupled to the DFRs at the off-axis angle of 20°, a focal spot of 3.5 μm was observed at the distance of 1000 μm from the lens surface, which was close to theoretical value.</abstract><pub>The Japan Society of Applied Physics</pub><doi>10.1143/JJAP.50.06GL02</doi></addata></record> |
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| source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
| title | Off-Axis Diffractive Focusing Reflectors for Refractive Index Sensing in Microfluidic Devices |
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