Evaluation of Polar Anchoring Energy Based on Symmetric Oblique Incident Transmission Ellipsometry Method: the Voltage Diminution by Alignment Films
Polar anchoring energy coefficient is one of the important parameters to improve the performance of liquid crystal displays (LCDs). To determine the polar anchoring energy coefficient with high accuracy, the symmetric oblique incident transmission ellipsometry (SOITE) method with voltage correction...
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Veröffentlicht in: | Japanese Journal of Applied Physics 2011-01, Vol.50 (1), p.01BA01-01BA01-3 |
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container_title | Japanese Journal of Applied Physics |
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creator | Tachibana, Kazuya Goda, Kazuya Kaneko, Yoshiyuki Inoue, Masaru Kimura, Munehiro Akahane, Tadashi |
description | Polar anchoring energy coefficient is one of the important parameters to improve the performance of liquid crystal displays (LCDs). To determine the polar anchoring energy coefficient with high accuracy, the symmetric oblique incident transmission ellipsometry (SOITE) method with voltage correction is proposed. As a result, the polar anchoring energy coefficients are found to be little affected by the voltage diminution at the alignment film and can be determined by the SOITE method. However, the reduced elastic anisotropy $\kappa$ was not fixed by changing the thickness of the alignment film. These results indicate a possibility that the SOITE method with voltage correction can be used to determine the device parameters with high accuracy. Consequently, it may contribute to the technological development of high-performance LCDs. |
doi_str_mv | 10.1143/JJAP.50.01BA01 |
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To determine the polar anchoring energy coefficient with high accuracy, the symmetric oblique incident transmission ellipsometry (SOITE) method with voltage correction is proposed. As a result, the polar anchoring energy coefficients are found to be little affected by the voltage diminution at the alignment film and can be determined by the SOITE method. However, the reduced elastic anisotropy $\kappa$ was not fixed by changing the thickness of the alignment film. These results indicate a possibility that the SOITE method with voltage correction can be used to determine the device parameters with high accuracy. 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To determine the polar anchoring energy coefficient with high accuracy, the symmetric oblique incident transmission ellipsometry (SOITE) method with voltage correction is proposed. As a result, the polar anchoring energy coefficients are found to be little affected by the voltage diminution at the alignment film and can be determined by the SOITE method. However, the reduced elastic anisotropy $\kappa$ was not fixed by changing the thickness of the alignment film. These results indicate a possibility that the SOITE method with voltage correction can be used to determine the device parameters with high accuracy. 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To determine the polar anchoring energy coefficient with high accuracy, the symmetric oblique incident transmission ellipsometry (SOITE) method with voltage correction is proposed. As a result, the polar anchoring energy coefficients are found to be little affected by the voltage diminution at the alignment film and can be determined by the SOITE method. However, the reduced elastic anisotropy $\kappa$ was not fixed by changing the thickness of the alignment film. These results indicate a possibility that the SOITE method with voltage correction can be used to determine the device parameters with high accuracy. Consequently, it may contribute to the technological development of high-performance LCDs.</abstract><pub>The Japan Society of Applied Physics</pub><doi>10.1143/JJAP.50.01BA01</doi></addata></record> |
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title | Evaluation of Polar Anchoring Energy Based on Symmetric Oblique Incident Transmission Ellipsometry Method: the Voltage Diminution by Alignment Films |
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