Variation of Electrostatic Discharge Robustness Induced by the Surface Morphology of High Power Light-Emitting Diodes

The capability of high-power nitride-based light-emitting diodes (HPLED) to withstand electrostatic discharge (ESD) is very important key index due to the horizontal structure of the insulating property of the sapphire substrate. Accordingly, the investigation of ESD failure mechanisms is a benefici...

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Veröffentlicht in:	Japanese Journal of Applied Physics 2010-05, Vol.49 (5), p.056602-056602-5
Hauptverfasser:	Yang, Shih Chun, Lin, Pang, Fu, Han Kuei, Wang, Chien Ping, Chen, Tzung Te, Lee, An Tse, Huang, Sheng Bang, Chu, Mu Tao
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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