Mechanism Underlying Stacking-Layer Effect of Dielectric Properties of Multilayer Ceramic Capacitors

The stacking-layer effect in multilayer ceramic capacitors (MLCCs) is a phenomenon in which the dielectric permittivity of dielectric layers increases with increasing number of layers. To elucidate the mechanism underlying this effect, we performed a simulation of residual stress in MLCCs by the fin...

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Veröffentlicht in:	Japanese Journal of Applied Physics 2010-04, Vol.49 (4), p.041505-041505-5
Hauptverfasser:	Yokomizo, Satoshi, Hoshina, Takuya, Takeda, Hiroaki, Taniguchi, Katsuya, Mizuno, Youichi, Chazono, Hirokazu, Tsurumi, Takaaki
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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