Effects of Nanoscaled Tin-Doped Indium Oxide on the Image Sticking Property of Liquid Crystal Cells

Unusual residual time of image sticking under high-voltage electrostatic discharge (ESD) stress on liquid crystal (LC) cells has been observed. It was found that nanoscaled conductive particles doped in LC cells can significantly reduce the residual time of image sticking and the breakdown voltage o...

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Veröffentlicht in:	Japanese Journal of Applied Physics 2010-02, Vol.49 (2), p.025004-025004-6
Hauptverfasser:	Liang, Bau-Jy, Liu, Don-Gey, Shie, Wun-Yi, Huang, Sy-Ruen
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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