Transmission-Electron-Microscopy Observation of Pt Pillar Fabricated by Electron-Beam-Induced Deposition

Transmission-Electron-Microscopy Observation of Pt Pillar Fabricated by Electron-Beam-Induced Deposition

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Veröffentlicht in:Japanese Journal of Applied Physics 2009-06, Vol.48 (6S), p.6
Hauptverfasser: Murakami, Katsuhisa, Matsubara, Naoki, Ichikawa, Satoshi, Kisa, Toshiya, Nakayama, Takahito, Takamoto, Kunio, Wakaya, Fujio, Takai, Mikio, Petersen, Silke, Amon, Brigitte, Ryssel, Heiner
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container_end_page
container_issue 6S
container_start_page 6
container_title Japanese Journal of Applied Physics
container_volume 48
creator Murakami, Katsuhisa
Matsubara, Naoki
Ichikawa, Satoshi
Kisa, Toshiya
Nakayama, Takahito
Takamoto, Kunio
Wakaya, Fujio
Takai, Mikio
Petersen, Silke
Amon, Brigitte
Ryssel, Heiner
description
doi_str_mv 10.1143/JJAP.48.06FF12
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fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1143_JJAP_48_06FF12</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1143_JJAP_48_06FF12</sourcerecordid><originalsourceid>FETCH-LOGICAL-c305t-c48593347687b766ad507283791452fa6b6412e2a4f5cc724ff6dd5681aa4f343</originalsourceid><addsrcrecordid>eNo9kMtOwzAQRS0EEqGwZe0fcPBj7CTLUhpoVdQuyjpyHFsYpUlkB6T-PYmKWM3j6o7uHIQeGU0ZA_G03S4PKeQpVWXJ-BVKmICMAFXyGiWUckag4PwW3cX4NY1KAkvQ5zHoLp58jL7vyLq1ZgxT8-5N6KPphzPe19GGHz1OOu4dPoz44NtWB1zqOnijR9vg-oz_rc9Wn8ima77NJLzYoY9-9t6jG6fbaB_-6gJ9lOvj6o3s9q-b1XJHjKByJAZyWYgpuMqzOlNKN5JmPBdZwUByp1WtgHHLNThpTMbBOdU0UuVMTysBYoHSy935gRisq4bgTzqcK0armVM1c6ogry6cxC-bWVw3</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Transmission-Electron-Microscopy Observation of Pt Pillar Fabricated by Electron-Beam-Induced Deposition</title><source>HEAL-Link subscriptions: Institute of Physics (IOP) Journals</source><source>Institute of Physics Journals</source><creator>Murakami, Katsuhisa ; Matsubara, Naoki ; Ichikawa, Satoshi ; Kisa, Toshiya ; Nakayama, Takahito ; Takamoto, Kunio ; Wakaya, Fujio ; Takai, Mikio ; Petersen, Silke ; Amon, Brigitte ; Ryssel, Heiner</creator><creatorcontrib>Murakami, Katsuhisa ; Matsubara, Naoki ; Ichikawa, Satoshi ; Kisa, Toshiya ; Nakayama, Takahito ; Takamoto, Kunio ; Wakaya, Fujio ; Takai, Mikio ; Petersen, Silke ; Amon, Brigitte ; Ryssel, Heiner</creatorcontrib><identifier>ISSN: 0021-4922</identifier><identifier>EISSN: 1347-4065</identifier><identifier>DOI: 10.1143/JJAP.48.06FF12</identifier><language>eng</language><ispartof>Japanese Journal of Applied Physics, 2009-06, Vol.48 (6S), p.6</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c305t-c48593347687b766ad507283791452fa6b6412e2a4f5cc724ff6dd5681aa4f343</citedby><cites>FETCH-LOGICAL-c305t-c48593347687b766ad507283791452fa6b6412e2a4f5cc724ff6dd5681aa4f343</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27903,27904</link.rule.ids></links><search><creatorcontrib>Murakami, Katsuhisa</creatorcontrib><creatorcontrib>Matsubara, Naoki</creatorcontrib><creatorcontrib>Ichikawa, Satoshi</creatorcontrib><creatorcontrib>Kisa, Toshiya</creatorcontrib><creatorcontrib>Nakayama, Takahito</creatorcontrib><creatorcontrib>Takamoto, Kunio</creatorcontrib><creatorcontrib>Wakaya, Fujio</creatorcontrib><creatorcontrib>Takai, Mikio</creatorcontrib><creatorcontrib>Petersen, Silke</creatorcontrib><creatorcontrib>Amon, Brigitte</creatorcontrib><creatorcontrib>Ryssel, Heiner</creatorcontrib><title>Transmission-Electron-Microscopy Observation of Pt Pillar Fabricated by Electron-Beam-Induced Deposition</title><title>Japanese Journal of Applied Physics</title><issn>0021-4922</issn><issn>1347-4065</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><recordid>eNo9kMtOwzAQRS0EEqGwZe0fcPBj7CTLUhpoVdQuyjpyHFsYpUlkB6T-PYmKWM3j6o7uHIQeGU0ZA_G03S4PKeQpVWXJ-BVKmICMAFXyGiWUckag4PwW3cX4NY1KAkvQ5zHoLp58jL7vyLq1ZgxT8-5N6KPphzPe19GGHz1OOu4dPoz44NtWB1zqOnijR9vg-oz_rc9Wn8ima77NJLzYoY9-9t6jG6fbaB_-6gJ9lOvj6o3s9q-b1XJHjKByJAZyWYgpuMqzOlNKN5JmPBdZwUByp1WtgHHLNThpTMbBOdU0UuVMTysBYoHSy935gRisq4bgTzqcK0armVM1c6ogry6cxC-bWVw3</recordid><startdate>20090601</startdate><enddate>20090601</enddate><creator>Murakami, Katsuhisa</creator><creator>Matsubara, Naoki</creator><creator>Ichikawa, Satoshi</creator><creator>Kisa, Toshiya</creator><creator>Nakayama, Takahito</creator><creator>Takamoto, Kunio</creator><creator>Wakaya, Fujio</creator><creator>Takai, Mikio</creator><creator>Petersen, Silke</creator><creator>Amon, Brigitte</creator><creator>Ryssel, Heiner</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20090601</creationdate><title>Transmission-Electron-Microscopy Observation of Pt Pillar Fabricated by Electron-Beam-Induced Deposition</title><author>Murakami, Katsuhisa ; Matsubara, Naoki ; Ichikawa, Satoshi ; Kisa, Toshiya ; Nakayama, Takahito ; Takamoto, Kunio ; Wakaya, Fujio ; Takai, Mikio ; Petersen, Silke ; Amon, Brigitte ; Ryssel, Heiner</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c305t-c48593347687b766ad507283791452fa6b6412e2a4f5cc724ff6dd5681aa4f343</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Murakami, Katsuhisa</creatorcontrib><creatorcontrib>Matsubara, Naoki</creatorcontrib><creatorcontrib>Ichikawa, Satoshi</creatorcontrib><creatorcontrib>Kisa, Toshiya</creatorcontrib><creatorcontrib>Nakayama, Takahito</creatorcontrib><creatorcontrib>Takamoto, Kunio</creatorcontrib><creatorcontrib>Wakaya, Fujio</creatorcontrib><creatorcontrib>Takai, Mikio</creatorcontrib><creatorcontrib>Petersen, Silke</creatorcontrib><creatorcontrib>Amon, Brigitte</creatorcontrib><creatorcontrib>Ryssel, Heiner</creatorcontrib><collection>CrossRef</collection><jtitle>Japanese Journal of Applied Physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Murakami, Katsuhisa</au><au>Matsubara, Naoki</au><au>Ichikawa, Satoshi</au><au>Kisa, Toshiya</au><au>Nakayama, Takahito</au><au>Takamoto, Kunio</au><au>Wakaya, Fujio</au><au>Takai, Mikio</au><au>Petersen, Silke</au><au>Amon, Brigitte</au><au>Ryssel, Heiner</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Transmission-Electron-Microscopy Observation of Pt Pillar Fabricated by Electron-Beam-Induced Deposition</atitle><jtitle>Japanese Journal of Applied Physics</jtitle><date>2009-06-01</date><risdate>2009</risdate><volume>48</volume><issue>6S</issue><spage>6</spage><pages>6-</pages><issn>0021-4922</issn><eissn>1347-4065</eissn><doi>10.1143/JJAP.48.06FF12</doi></addata></record>
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language eng
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title Transmission-Electron-Microscopy Observation of Pt Pillar Fabricated by Electron-Beam-Induced Deposition
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-24T20%3A24%3A16IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Transmission-Electron-Microscopy%20Observation%20of%20Pt%20Pillar%20Fabricated%20by%20Electron-Beam-Induced%20Deposition&rft.jtitle=Japanese%20Journal%20of%20Applied%20Physics&rft.au=Murakami,%20Katsuhisa&rft.date=2009-06-01&rft.volume=48&rft.issue=6S&rft.spage=6&rft.pages=6-&rft.issn=0021-4922&rft.eissn=1347-4065&rft_id=info:doi/10.1143/JJAP.48.06FF12&rft_dat=%3Ccrossref%3E10_1143_JJAP_48_06FF12%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true